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39 results about "Spot intensity" patented technology

Super-resolution fluorescent lifetime imaging method and device based on stimulated emission lost

The invention discloses a super-resolution fluorescent lifetime imaging method based on stimulated emission lost. The super-resolution fluorescent lifetime imaging method based on the stimulated emission lost includes the flowing steps: (1) projecting a first laser beam on a to-be-tested sample and activating grains in the to-be-tested sample to an excited sate; (2) utilizing stimulated emission depletion (STED) light to consume the number of the grains which are in the excited state in step (1); (3) utilizing a second laser beam to stimulate the rest grains to emit fluorescent light and collecting the fluorescent light to obtain corresponding fluorescence intensity images; (4) arranging delay between the second laser beam and the STED light, changing delay time, repeating step (3), and obtaining the fluorescence intensity images under different delay time; (5) conducting treatment on the fluorescence intensity images in different delay time through a computer, and fitting a spot intensity attenuation law, inverting lifetime images, and completing scanning of one point of the to-be-tested sample; (6) and completing two-dimension scanning on the sample to be tested by changing the positions where the beam is projected on the to-be-tested sample. The invention further discloses a device used for implementing the method.
Owner:ZHEJIANG UNIV

Double helix light beam-based sample axial drift detection and compensation method and device

InactiveCN103399413AAchieve real-time high precisionRealize a wide range of measurementsMicroscopesCurrent sampleLight beam
The invention discloses a double helix light beam-based sample axial drift detection and compensation method. The method comprises the following steps: performing phase modulation on a collimated laser beam to obtain a double helix illuminating light beam and projecting to a sample to be detected on a three-dimensional nano scanning platform to obtain a reflected light beam; focusing the reflected light beam into a focusing spot with two intensity peak values; receiving the focusing spot by using a photoelectric induction device to obtain spot intensity distribution information; calculating an included angle between a connecting line of the two intensity peak values and the horizontal direction according to the spot intensity distribution information; establishing a calibration function by using the relation of the included angle and axial drift of the sample; when the sample to be detected drifts in axial position, obtaining the axial drift of the current sample according to the calibration function by using the included angle measured in real time and then adjusting the axial position of the three-dimensional nano scanning platform to finish correction of the axial position of the sample to be detected. The invention also discloses a double helix light beam-based sample axial drift detection and compensation device.
Owner:ZHEJIANG UNIV

Method for generating and measuring first-order circular Airy derivative light beam with sudden self-focusing effect and carrying vortex

PendingCN114815278ATo overcome the fatal shortcoming that the intensity distribution is solidEasy to measurePhotometryOptical elementsSource planeSpatial light modulator
The invention discloses a method for generating and measuring a first-order circular Airy derivative light beam with a sudden self-focusing effect and carrying a vortex. The method comprises the following steps: enabling a linear polarization Gaussian beam generated by a laser to pass through a beam expander, a reflector, a beam splitter, a specifically coded reflection type pure phase spatial light modulator, the beam splitter, a circular diaphragm and a Fourier lens in sequence; wherein the distance from the spatial light modulator to the Fourier lens and the distance from the Fourier lens to the Fourier plane/source plane are the focal length of the Fourier lens, and an expected first-order circular Airy derivative light beam carrying a vortex can be obtained on the Fourier plane/source plane; a light beam profile analyzer is mounted on the electric guide rail in the transmission direction of the generated light beam so as to measure intensity distribution and sudden self-focusing capability under different propagation distances; the generated first-order circular Airy derivative beam carrying one vortex has the advantages of hollow focus intensity distribution and carrying orbital angular momentum on the basis of retaining sudden self-focusing capability, and the application range is expanded compared with the first-order circular Airy derivative beam.
Owner:ZHEJIANG FORESTRY UNIVERSITY

A Wavefront Restoration Method Based on Shack-Hartmann Wavefront Sensor

ActiveCN112484866BAvoid falling intoImproving the Accuracy of Wavefront RestorationOptical measurementsLocal optimumHigh density
The invention discloses a wavefront restoration method based on a Shack-Hartmann wavefront sensor. The method takes the correlation function of the theoretical far-field light intensity distribution and the measured far-field light intensity distribution as the objective function, and modulates the optimized random The parallel gradient descent method recovers the wavefront. The invention takes the far-field spot intensity distribution as the input of the algorithm, makes full use of the information in the sub-aperture, effectively reduces the dependence of the Shack-Hartmann wavefront sensor on the high-density sub-aperture, improves the wavefront restoration accuracy, and modulates the The factor modulates the Zernike coefficient disturbance in space and time, which can avoid the algorithm from falling into local optimum and speed up the algorithm convergence speed. Compared with the traditional Shack-Hartmann wavefront sensing algorithm, the present invention can restore the wavefront with higher accuracy under the same sub-aperture condition, and complete the wavefront restoration with a smaller number of sub-apertures under the same restoration accuracy, which is: Low-light, high-precision wavefront detection and other fields provide a new technical approach.
Owner:INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI

Super-resolution fluorescent lifetime imaging method and device based on stimulated emission lost

InactiveCN103163106BImprove spatial resolutionAchieve super-resolution fluorescence lifetime imagingMicroscopesFluorescence/phosphorescenceLight spotTest sample
The invention discloses a super-resolution fluorescent lifetime imaging method based on stimulated emission lost. The super-resolution fluorescent lifetime imaging method based on the stimulated emission lost includes the flowing steps: (1) projecting a first laser beam on a to-be-tested sample and activating grains in the to-be-tested sample to an excited sate; (2) utilizing stimulated emission depletion (STED) light to consume the number of the grains which are in the excited state in step (1); (3) utilizing a second laser beam to stimulate the rest grains to emit fluorescent light and collecting the fluorescent light to obtain corresponding fluorescence intensity images; (4) arranging delay between the second laser beam and the STED light, changing delay time, repeating step (3), and obtaining the fluorescence intensity images under different delay time; (5) conducting treatment on the fluorescence intensity images in different delay time through a computer, and fitting a spot intensity attenuation law, inverting lifetime images, and completing scanning of one point of the to-be-tested sample; (6) and completing two-dimension scanning on the sample to be tested by changing the positions where the beam is projected on the to-be-tested sample. The invention further discloses a device used for implementing the method.
Owner:ZHEJIANG UNIV

Method for measuring spot intensity distribution of reflective concentrating photovoltaic concentrator

The invention relates to reflecting type concentrating photovoltaics, in particular to a method for measuring the distribution of the intensity of light spots of a reflecting type concentrating photovoltaic condenser. The method for measuring the distribution of the intensity of the light spots of the reflecting type concentrating photovoltaic condenser is characterized by including the following steps that a rotating parabolic reflecting surface is divided into reflecting elements with a certain area; a detector is utilized to record imaging of sunlight on a reflecting plate after the sunlight is reflected by the reflecting elements, and the imaging is used as image elements; the image elements are stacked to obtain the distribution of the light intensity on the reflecting plate of the reflecting type condenser. The method has the advantages that a method which is simple and convenient to operate and used for measuring the uniformity of the light spots is provided for the high-power reflecting type concentrating photovoltaics, so that it is possible to measure the uniformity of the light spots which are high in energy current density and to measure the spacial distribution of the light intensity of the light spots which are high in energy current intensity.
Owner:兰州大成科技股份有限公司 +1

A Method for Acquiring Time-Space-Frequency Information of Ultrashort Pulse Laser Far-field Focal Spot

ActiveCN111982313BAvoid the influence of far-field focal spot distributionIdeal focal spot morphologyInstrumentsUltra short pulseOptical spectrometer
The invention discloses a method for acquiring time-space-frequency information of the far-field focal spot of an ultrashort pulse laser, and aims to solve the problem that the chromatic aberration of the existing transmission-type magnifying imaging system will cause the position of the far-field focal spot of the magnified imaging relative to the target point. A technical problem with changes in the distribution of far-field focal spots. The invention obtains the interference images at the focal plane position of the measured ultrashort pulse laser, at least one positive defocus position, and at least one negative defocus position through the interference imaging spectrometer; and then uses the interference spectrum imaging technology to process each interference image separately The corresponding focal spot intensity space-frequency information is obtained; based on all the focal spot intensity space-frequency information obtained, the two-dimensional information of the far-field focal spot space phase at each frequency in the measured ultrashort pulse laser is reconstructed by phase recovery technology ; Finally, according to the order of the frequency, the two-dimensional information of the spatial phase of all the far-field focal spots obtained is reconstructed to obtain the space-time-frequency information of the phase of the ultrashort pulse laser far-field focal spot.
Owner:XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI

Method for acquiring space-time-frequency information of ultra-short pulse laser far-field focal spot

ActiveCN111982313AAvoid the influence of far-field focal spot distributionIdeal focal spot morphologyInstrumentsImaging spectrometerMaterials science
The invention discloses an ultra-short pulse laser far-field focal spot space-time-frequency information acquisition method, and aims to solve the technical problem that chromatic aberration of an existing transmission-type amplification imaging system causes change of far-field focal spot distribution of amplification imaging relative to a target point position. The method comprises: acquiring interference images of a focal plane position, at least one positive defocusing position and at least one negative defocusing position of a measured ultra-short pulse laser through an interference imaging spectrometer; respectively processing each interference image by adopting an interference spectrum imaging technology to obtain corresponding focal spot intensity space-frequency information; reconstructing far-field focal spot space phase two-dimensional information under each frequency in the measured ultra-short pulse laser through a phase recovery technology based on all the obtained focalspot intensity space-frequency information; and finally, reconstructing the obtained two-dimensional information of the spatial phases of all the far-field focal spots according to the size sequence of the frequency to obtain time-space-frequency information of the far-field focal spot phases of the ultra-short pulse laser.
Owner:XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI

Infrared detection device

ActiveCN107543617BSuppresses the effects of image distortionOptical detectionSensing radiation from moving bodiesInfraredLine sensor
Provided is an infrared detection device capable of suppressing the influence of image distortion caused by an optical system. Equipped with: a lens that transmits infrared light; and an infrared sensor that has infrared detection elements arranged in two or more rows, and scans the detection target range by rotating around a scanning rotation axis that passes through a part of the lens, and outputs an indication The output signal of the thermal image of the detection object range, at least two infrared detection elements of the infrared sensor are arranged at positions offset from the scanning rotation axis, and the image in the scanning direction of the infrared detection elements arranged in two or more columns The number of the first infrared detection elements whose half width of the point intensity distribution is smaller than the half width of the image point intensity distribution in the direction of the scanning rotation axis is more than the number of image points in the scanning direction in the infrared detection elements arranged in two or more columns The number of second infrared detection elements whose half width of the intensity distribution is larger than the half width of the pixel intensity distribution in the direction of the scanning rotation axis.
Owner:PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO LTD

An adaptive laser spectroscopy and imaging method suitable for deep space micro-analysis

The invention discloses an adaptive laser spectrum and imaging method suitable for deep space micro-region analysis. The method is realized on an adaptive laser spectrum and imaging detection system.The method comprises the following five steps: expected focal spot adaptive focusing calibration, single-point tight focusing of a detection object, Raman fluorescence and imaging information acquisition, Raman fluorescence imaging scanning micro-region analysis, and LIBS (Laser-induced Breakdown Spectroscopy) scanning micro-region analysis and information fusion. The method disclosed by the invention has the beneficial effects that an adaptive laser spectrum and imaging detection method is provided, and the diameter of focusing spots can be adaptively adjusted during micro-region analysis; the regional average grey degree of an electron microscope serves as scanning imaging point intensity, and the self-focusing and wide spectrum scanning imaging requirements are met; and three-dimensional space LIBS elemental analysis, active laser Raman molecular analysis, hyperspectral fluorescence and visible wide spectrum scanning imaging can be simultaneously realized, and multiple kinds of information can be provided for performing micro-region fine detection.
Owner:SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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