21 results about "Spot intensity" patented technology

The invention discloses a quantitative analysis method for spatial distribution of material elements. The method comprises the following steps: acquiring a spatial intensity distribution diagram of to-be-detected elements in a sample by utilizing a micro-area imaging technology; measuring the average concentration of the to-be-measured element through an element quantitative analysis technology; carrying out normalization processing on the spatial intensity distribution diagram by taking the average concentration as a reference, and establishing a mapping model of an intensity value and an absolute concentration value; and according to the mapping model, converting the intensity value of each pixel point in the spatial intensity distribution diagram into an absolute concentration value, and generating a quantitative spatial distribution diagram of the elements. According to the method, element quantitative data and imaging data are coupled, the dependence of a traditional method on a matrix matching standard substance is broken through, accurate spatial quantitative analysis from ppm-level impurities to major elements under the micro-nano scale is realized, and the method has the characteristics of good traceability, full-concentration coverage, multi-technology compatibility and the like; the method can be widely applied to element distribution characterization of complex systems such as composite nanomaterials and heterojunction devices, and a reliable analysis means is provided for material performance optimization.

Embodiments of the present application propose an imaging system based on super-Raleigh limit focusing lens and its application, which can be widely applied in the technical fields of photolithography, biomedical, optical imaging and nanometer structure precision measurement; the system can produce transverse wave vector distribution and excitation and detection vector beams with wave vector range meeting the requirements by wave vector ring modulation on incident linearly polarized light, focus the vector beams to make the focusing field meet the scale requirements, so as to obtain super-Raleigh limit excitation PSF and detection PSF, and obtain a confocal PSF capable of exciting high-order terms of spot intensity by superimposing the excitation and detection PSFs, thereby improving the imaging resolution of the system; on the other hand, the system can use solid and hollow focusing spots formed by focusing vector beams to form an image, and calculate according to the imaging result to reduce interference, so as to obtain a high-resolution detection result far exceeding the Raleigh diffraction limit, and further improve the resolution of the imaging system.

The invention provides a spectral measurement method and system based on a linear adjustable optical filter, and the method comprises the steps: building a pixel-wavelength calibration curve of a spectrum detection system based on the spectrum detection system constructed by a white light source, a linear optical filter and a detector; calculating the light transmittance of the whole spectrum detection system; collecting a to-be-measured light source by using a spectrum detection system to obtain a relationship between the intensity of the to-be-measured light source and a pixel point; and obtaining the distribution of the intensity and wavelength of the light source to be measured according to the relationship between the intensity of the light source to be measured and the pixel points and based on the established pixel-wavelength calibration curve, the light transmittance and a system spectrum calculation formula. According to the grating-free spectrum detection method based on the linear adjustable optical filter, spectrum reduction is achieved on the detection result of the detector, the pixel point-intensity relation is converted into the wavelength-intensity relation, the structure and principle are simple, the price is low, and the grating-free spectrum detection method is suitable for the fields of scientific research, precise optical measurement, unknown optical wavelength analysis and the like.

The invention discloses a sparse near-field SAR (Synthetic Aperture Radar) imaging method based on multi-constraint index high-order total variation, which belongs to the technical field of radar imaging and comprises the following steps: S1, sampling a scene and preprocessing scene echo data; s2, calculating an NFCS approximate observation operator; s3, constructing a mixed sparse near-field SAR imaging model; s4, initializing parameters of the mixed sparse near-field SAR imaging model and an NFCS approximate observation operator; s5, updating the mixed sparse near-field SAR imaging model, and completing near-field SAR mixed constraint sparse imaging; and S6, performing imaging output. According to the method provided by the invention, target scattering intensity amplitude information can be accurately reconstructed, underestimation of L1 regularization on target scattering point intensity is avoided, speckle noise can be suppressed, artifacts can be avoided, difference between target sparsity and target scattering intensity is considered, and complex scene imaging performance is improved.

The application discloses a Shack-Hartmann-based centroid calculation acceleration method, which determines the effective row pixel range of a sub-aperture by the spot intensity information in the Shack-Hartmann sub-aperture, selects the effective pixels in a single Shack-Hartmann sub-aperture for centroid calculation, avoids waiting for the invalid pixels in the sub-aperture in the image acquisition process, thereby accelerating the centroid calculation speed, and improving the control bandwidth of an adaptive optical system without affecting the wavefront recovery accuracy.

A crystal structure analysis in which: each of a plurality of samples are irradiated while the angle of incidence is continuously changed by rotating the crystal, whereby diffraction spot intensity and reliability for a plurality of crystal lattice planes are determined and a data set (Data-1, Data-2, Data-3, . . . , Data-n) is acquired; whether or not to perform merging, which is a process of combining multiple sets of data into one, is determined for each individual set of data on the basis of a merging criterion (e.g., Rint, completeness); merging is performed on data for which merging is to be performed; and a crystal structure is determined according to merged data. A crystal structure analysis result is obtained in a crystal structure analysis method, a crystal structure analysis device, and a crystal structure analysis program in which a crystal structure is determined by data-processing and analyzing a plurality of diffraction profiles.

In one embodiment, a method of measurement of wavefronts according to the invention, wherein a beam emitted by coherent light source 1 passes through a system that forms it into a widened light beam, which system comprises first microscopic lens 2 and first lens 3, wherein the beam then illuminates analysed object 4 that modifies the wavefront of the light beam, the beam subsequently passes through an array of vortex lenses 5, which divides the beam into smaller fragments and introduces optical vortex beams with topological charges m into each fragment, simultaneously focusing them on detector 6 that analyses the image by recording the distribution of intensity and visualises the focused optical vortex beams with a characteristic point of discontinuity with a zero level of intensity in its centre.

The present application relates to the field of seeing detection, and particularly relates to a large aperture telescope high dynamic camera seeing detection system and a detection method, wherein the detection system comprises: a fiber laser for emitting a detection beam; a mirror group distributed around the top of a to-be-detected mirror surface for reflecting the detection beam multiple times so that the detection beam passes through the detection area of the to-be-detected mirror surface multiple times; a microlens array for dividing the distorted wavefronts passing through the detection area of the to-be-detected mirror surface multiple times into a plurality of distorted sub-wavefronts and focusing the distorted sub-wavefronts onto a CCD detector array; the CCD detector array, wherein the CCD detectors are arranged in steps, for receiving the defocused and non-defocused distorted sub-wavefronts and obtaining different degrees of spot intensity; a neural network taking different spot intensities as input and camera seeing Zernike solution as output, and finally obtaining the camera seeing. The present application can perform wide-range seeing detection and has the characteristics of large flux and high efficiency.

The invention discloses an end-to-end super-resolution calculation imaging method based on an optical super-oscillation physical model. The method comprises the following steps: step 1, optical field distribution calculation based on an optical super-oscillation phenomenon; 2, analyzing the effect of super-oscillation high-frequency information in a super-resolution image recovery process, and designing a back-end calculation imaging method based on a super-oscillation light field; and step 3, constructing a deep learning model of super-oscillation light field imaging and back-end image restoration, and realizing super-resolution image restoration. According to the invention, the problem of discrete design of the super oscillation device design and the back-end calculation imaging method in the traditional super oscillation imaging process is solved, and the joint optimization design of the super oscillation light field modulation device and the back-end algorithm is realized; the problems of low signal-to-noise ratio such as low super-diffraction center focal spot intensity, large side lobe interference and small view field in a single-frame super-oscillation imaging process are solved, and end-to-end super-resolution imaging is realized.

This application provides a training method, phase compensation method, and electronic device for a time-series prediction model of turbulence in space optical communication. The method includes: acquiring distorted spot intensity data from multiple frames of historical moments collected by the receiver in a space optical communication system, and constructing a historical spot intensity sequence based on a preset sliding window; performing multiple rounds of self-supervised learning steps on a spatiotemporal prediction network, including: inputting the historical spot intensity sequence into a 3D convolutional neural network in the spatiotemporal prediction network to generate a predicted phase screen for the target prediction moment; converting it into predicted spot intensity using an angular spectral transmission model, and acquiring the actual detected spot intensity at the target prediction moment; constructing a loss function and calculating the target loss value to update the parameters of the spatiotemporal prediction network; if the model converges, outputting the spatiotemporal prediction network as a time-series prediction model for turbulence in space optical communication. This application can solve the problems of significant lack of temporal dimension information and response lag in existing technologies.

The invention discloses a focal plane adjusting method for detecting cross section characteristics of an electron beam, and belongs to the technical field of micro-nano machining. In order to solve the problem that an existing electron beam characterization method cannot obtain the cross section characteristics of an electron beam in an out-of-focus state, automatic focusing and out-of-focus of the electron beam in different planes are realized by preparing a focal plane adjusting chip with a plurality of groups of electron beam alignment marks positioned on an exposure surface of a substrate and in a groove or / and a boss of the substrate; therefore, the intensity distribution of the electron beam spots in focusing and defocusing states is detected. According to the invention, the geometric aberration and focal depth characteristics of the electron beam can be accurately evaluated, and the imaging precision and process stability of electron beam lithography are improved.

This application provides a spot detection control method, device, and spot detection system, which are applied to spot detection control equipment. First, according to the change information between the laser spot sizes corresponding to different positions on the main optical axis when the laser emitted by the laser is transmitted to these positions, the spot analyzer is controlled to move to the focal position on the main optical axis; then, the spot detection result of the laser is determined based on the first spot information collected by the spot analyzer at the focal position. The first spot information includes at least one of spot size, spot shape, and spot intensity data. This realizes the automatic real-time movement adjustment of the spot analyzer, ensures the accuracy of movement adjustment, improves the efficiency of moving the spot analyzer to the focal position, and thus enhances the detection efficiency of the detection result.

The invention relates to the field of semiconductor light-emitting devices, and discloses a narrow-spectrum super-radiation light-emitting diode structure which comprises a packaging shell, a semiconductor chip, a collimating lens, an optical filter, a converging lens and a coupling optical fiber. The collimating mirror is used for collimating light beams emitted by the semiconductor chip and adjusting light spot intensity distribution parameters of the light beams; the light filter is used for regulating and controlling spectral parameters of light beams emitted by the semiconductor chip; the converging lens is used for converging and coupling the emergent light beams passing through the light filter to the coupling optical fiber; according to the invention, by optimizing the design of an internal light path of the device and adding wavelength selection devices such as the optical filter to regulate and control the emergent spectrum of the light-emitting diode device, compared with an existing super-radiation light-emitting diode, a smaller emergent spectrum width can be realized and more abundant output spectrum patterns and customized selection of central wavelength are provided; therefore, the customized design and processing requirements of the tube core can be reduced, the processing consistency requirement of the tube core is reduced, the manufacturing difficulty and cost are reduced, and the integration level and the stability are obviously improved.

This invention discloses a method for coordinated correction of optical field intensity and phase based on multi-layer deformable mirrors, belonging to the field of adaptive optics technology. The method involves configuring multiple conjugate deformable mirrors in the optical path. The first deformable mirror is conjugate to the upper turbulent layer and employs a stochastic parallel gradient descent algorithm based on the statistical characteristics of sub-aperture spot intensity, using the variance of sub-aperture spot intensity as the cost function for control. It utilizes the angular spectrum diffraction transmission mechanism to transform upper-layer phase modulation into receiver amplitude modulation, achieving light intensity homogenization. The second deformable mirror is conjugate to the telescope pupil plane, and based on light intensity homogenization, a wavefront reconstruction algorithm is used to perform closed-loop correction of the residual phase. This invention achieves layered decoupled control of light intensity and phase, effectively suppressing strong scintillation effects and expanding the working boundary of adaptive optics systems under harsh atmospheric conditions.

This invention discloses a sparse near-field SAR imaging method based on high-order total variation with multiple constraint exponents, belonging to the field of radar imaging technology. The method includes the following steps: S1, sampling the scene and preprocessing the scene echo data; S2, calculating the NFCS approximate observation operator; S3, constructing a hybrid sparse near-field SAR imaging model; S4, initializing the parameters of the hybrid sparse near-field SAR imaging model and the NFCS approximate observation operator; S5, updating the hybrid sparse near-field SAR imaging model to complete hybrid constraint sparse near-field SAR imaging; and S6, outputting the imaging results. The method proposed in this invention can accurately reconstruct the target scattering intensity amplitude information, avoiding the underestimation of target scattering point intensity by L1 regularization, while also suppressing speckle noise and avoiding artifacts. It takes into account both the sparsity of the target and the differences in target scattering intensity, improving the imaging performance of complex scenes.

The invention provides a sub-aperture light spot intensity crosstalk suppression device for a Shack-Hartmann wavefront sensor, and belongs to the technical field of optical wavefront aberration measurement. The device comprises a microlens array, a light spot intensity crosstalk suppressor, an image sensor and a data processing computer. The micro-lens array divides the collimated light beam into a plurality of sub-light beams and focuses the sub-light beams; the light spot intensity crosstalk suppressor is arranged between the micro-lens array and the image sensor, realizes three-dimensional physical isolation of adjacent sub-aperture light spots through a light absorption material or an optical waveguide structure, and suppresses intensity crosstalk; the image sensor collects the isolated sub-light spot images; and the data processing computer calculates the mass center position of each sub-aperture light spot. According to the invention, crosstalk suppression is realized on the hardware level, the calculation precision, stability and robustness of the centroid are improved, and the method is suitable for wavefront detection under the conditions of a high dynamic range and a complex light field.

The invention relates to the field of visual detection, and discloses a game card surface defect visual detection method and system, which are used for effectively improving the accuracy of game card surface defect detection. Comprising the following steps: controlling a multi-directional light source to illuminate in sequence, acquiring an image sequence to construct a multi-angle illumination image set, performing phase demodulation and the like to generate phase field distribution, further constructing a phase singular point intensity diagram, identifying a defect candidate area according to singular point density distribution and topological surrounding characteristics, and determining a boundary. And geometric features and phase anomaly features of the defect candidate region are extracted, and the defect type and severity are judged in combination with a preset rule. According to the method, through multi-angle illumination and comprehensive feature analysis, the problems of single illumination, inaccurate feature extraction and the like of a traditional detection method are effectively solved, and the accuracy and reliability of detection are improved.

The application discloses a low-cost high-resolution single-point scanning laser beam quality measuring device and method, and relates to the technical field of laser beam quality measurement. The low-cost high-resolution single-point scanning laser beam quality measuring device comprises a focusing mirror, a light transmission plate and a single-tube detector; the light transmission plate is provided with a light transmission hole; and the focusing mirror, the light transmission hole and the single-tube detector are sequentially arranged along the light path propagation direction. The application realizes image collection of a non-visible light wave band laser spot, and further realizes measurement of laser beam quality; further, through the setting of an XY moving platform, the whole spot pattern of the laser beam can be acquired, the obtained image of the laser spot is not deformed, directly reflects the distribution of the laser spot intensity, and the accuracy of the image can be controlled through the selection of the XY moving platform accuracy; through the control of a magnifying glass and time sequence pulses in different directions, the subdivision collection of the spot is realized; and through simple and low-cost means, the collection of high-precision spots is realized.

This invention relates to a DOE-based beam-expanding illumination system for splicing holographic displays, comprising: a laser, a diffractive optical element, a rear lens, and a collimating lens arranged sequentially along the optical path; the laser provides a laser source; the diffractive optical element modulates the laser source wavefront, dividing and shaping the laser source into an M×N two-dimensional array of beam-splitting spots; the rear lens converges and controls the two-dimensional array of beam-splitting spots; the collimating lens collimates the converged beam-splitting spots to obtain M×N collimated illumination spots; and these spots are respectively illuminated onto multiple spatial light modulators arranged in an M×N array, and then synthesized into a complete spliced ​​hologram. This invention employs large-pixel diffractive optical elements with feature sizes in the micrometer range, combined with a lens group, to achieve efficient conversion and beam expansion from a single beam to multiple uniform illumination spots. The system is designed by controlling the output spot intensity distribution, divergence angle, and light energy utilization.

The invention belongs to the field of thermal management, discloses a nanoscale temperature measurement method based on four-dimensional scanning electron diffraction, and aims to solve the problems that in the existing temperature measurement technology, a temperature field is interfered in a contact mode, and non-contact optics is limited by diffraction limit, TEM related methods indirectly or samples. The method comprises the following steps: collecting a nanoscale region four-dimensional diffraction pattern of a sample by combining a scanning transmission electron microscope with a precession electron diffraction system; performing branch processing according to the number of sample elements: calculating a correction factor L of a single-element simple substance material based on a crystal structure, obtaining a Debye-Waller factor in combination with a linear fitting algorithm, and calculating a diffraction spot intensity ratio of a multi-element compound material; a temperature standard curve is established through in-situ heating, and nanoscale local temperature distribution real-time measurement of a to-be-measured sample is achieved. According to the invention, non-contact and nano-scale spatial resolution temperature measurement is realized, the device is adaptive to various element materials, and thermal distribution of an integrated nano device and a heterogeneous interface can be accurately mapped.

The invention discloses a linear array CMOS (Complementary Metal-Oxide-Semiconductor Transistor)-based method for positioning the center of a topped light spot under an overexposure condition, which comprises the following steps of: after an arc-tangent function is symmetrically processed by a shifting shaft, fitting and positioning various waveform characteristics appearing in the measurement process of a laser triangular displacement sensor according to an edge shape model after the arc-tangent function is symmetrically processed by the shifting shaft; comprising three steps of waveform preprocessing, arc tangent function edge model establishment and fitting positioning. According to the invention, based on an overexposure spot intensity distribution physical model and a fitting center image processing technology, the center of the light spot can be accurately positioned at a sub-pixel level under a poor imaging condition.