Radio frequency identification (rfid) device and method for testing the same

Abstract

A radio frequency identification (RFID) device and a test method thereof are disclosed. In this test method, the RFID device receives different kinds of tag selection addresses and memory addresses according to a time sharing scheme, so that one or more RFID tags are tested. The RFID device includes a tag chip and a test chip. The tag chip performs a test operation upon receiving a test input signal from an external node, and externally outputs a test output signal indicating a result of the test operation. The test chip tests the tag chip upon receiving an address and data from an external node via a test pad during a test mode.

Description

[0001] Cross References to Related Applications [0002] This application claims priority from Korean Patent Application No. 10-2009-0056372, 10-2009-0056374, 10-2009-0056388, 10-2009-0056389 and 10-2009-0056390 filed on June 24, 2009, It is hereby incorporated by reference in its entirety. technical field [0003] Embodiments of the present invention relate to radio frequency identification devices and testing methods thereof, and more particularly to enabling one test chip to test multiple tags included in an array of tag chips at the wafer level (ie, before the wafer is diced into individual circuits). Chip testing techniques. Background technique [0004] Radio frequency identification (RFID) tag chips have been widely used to automatically identify objects by using radio frequency (RF) signals. In order to automatically identify an object using an RFID tag chip, an RFID tag is first attached to the object to be identified, and an RFID reader communicates wirelessly wi...

AI Technical Summary

Problems solved by technology

[0015] However, there are more than thousands of RFID tags in one wafer, making the above test method of applying an RF signal to each of all RFID tags not cost-effective and inefficient

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