Unlock instant, AI-driven research and patent intelligence for your innovation.

Base board unit processed by using substrate, base board structure and manufacturing method thereof

A substrate and substrate technology, applied in the direction of final product manufacturing, sustainable manufacturing/processing, electrical components, etc., can solve the problems of great difficulty in manufacturing, without increasing the utilization rate of wafers, etc., to improve the surface area or surface area utilization efficiency, improving the effect of light trapping, and improving the effect of light absorption efficiency

Inactive Publication Date: 2013-07-24
SUNOVEL SUZHOU TECH
View PDF2 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, regardless of whether it is a single crystal substrate or a polycrystalline substrate, processing using the substrate thickness will bring other problems. For example, in the processing of solar cell substrates, in order to improve the light trapping effect, it is usually desired to However, it will be very difficult to form texture on the surface obtained by isotropic etching in single crystal substrate, and the surface obtained by anisotropic etching in polycrystalline substrate There are also very strict requirements for making suede
So far, there has not been a solution to increase wafer utilization and form texture on a specific surface based on the size of the existing wafer

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Base board unit processed by using substrate, base board structure and manufacturing method thereof
  • Base board unit processed by using substrate, base board structure and manufacturing method thereof
  • Base board unit processed by using substrate, base board structure and manufacturing method thereof

Examples

Experimental program
Comparison scheme
Effect test

no. 1 example

[0021] Such as figure 1 A schematic diagram of a substrate unit 200 according to an embodiment of the present invention is shown. The substrate unit is obtained by processing a substrate, and the substrate is a single crystal substrate, which may include, for example: single crystal Si, single crystal Ge, single crystal SiGe. The substrate may have a thickness of 0.2-2mm. The substrate unit includes a semiconductor substrate 101, which is a single crystal substrate with a first doping type, such as an N-type doping configuration or a P-type doping configuration, and the semiconductor substrate includes a first surface and an opposite The second surface, the third surface and the fourth surface opposite thereto, the crystal orientation of the third surface and the fourth surface is {111}; the second doping type formed on the third surface of the semiconductor substrate 1. The first semiconductor layer 202 with a textured surface.

[0022] In particular, the first surface and...

no. 2 example

[0031] The substrate unit of the present invention has been described above according to the first embodiment of the present invention, and the second embodiment of the present invention will be described below with reference to the accompanying drawings.

[0032] According to the second embodiment of the present invention, a substrate structure using a substrate for processing is provided, such as figure 2 As shown, the structure includes: a substrate unit array.

[0033] The substrate unit array includes a plurality of substrate units 200 arranged in a predetermined direction, for example along direction A, preferably, they may be a plurality of substantially parallel substrate units. Each of the substrate units 200 includes a semiconductor substrate 101-x, which is a single crystal substrate with a first doping type, and its material may be, for example, single crystal Si, single crystal Ge, or single crystal SiGe. The semiconductor substrate includes a first surface 301 ...

no. 3 example

[0054] The single crystal substrate unit has been described above in the first embodiment, and the substrate structure of the single crystal crystal orientation {111} and its manufacturing method have been described in the second embodiment, and the single crystal crystal orientation non-{111} }, the substrate unit, structure and manufacturing method thereof are described in detail (see the second embodiment for illustration).

[0055] According to a third embodiment of the present invention, a substrate structure processed by using a substrate is provided, and the structure includes: a substrate unit array.

[0056] The substrate unit array includes a plurality of substrate units arranged in a predetermined direction, preferably, they may be substantially parallel. Each of the substrate units includes a semiconductor substrate, and the semiconductor substrate is a single crystal substrate with a first doping type, and its material may be, for example, single crystal Si, single...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention provides a base board unit processed by using a substrate, a base board structure and a manufacturing method thereof. The base baord structure includes a base board unit array having a plurality of base board units, each base board unit includes: a first doping type of a single crystal semiconductor base board, having a first surface and a facing second surface, a third surface and a facing fourth surface, and a second doping type of a first semiconductor layer arranged on the third surface of the semiconductor base board and having a textured surface, wherein crystal orientation of the third and fourth surfaces is {111}; and a plurality of base sheets, wherein: for each base board of a spacing base board unit, the second surface and the second surface of the neighboring base board on one side share one base sheet, the first surface and the first surface of the neighboring base board on the other side share one base sheet, so as to form a Great Wall type structure of the base board structure. The invention effectively utilize thickness of the substrate and improves a processing surface area of a crystal wafer. When the base board structure is used for a solarbattery base board, the textured surface is capable of profitably improving light-falling effect and increasing light-receiving efficiency of a solar battery.

Description

technical field [0001] The invention relates to the field of semiconductor manufacturing, in particular to a substrate unit processed by using a substrate, a substrate structure and a manufacturing method thereof. Background technique [0002] In recent years, with the rapid development of the semiconductor industry, semiconductor devices continue to develop in the direction of small size, high circuit density, high speed, and low power consumption. Integrated circuits have now entered the sub-micron technology stage. Therefore, in order to meet the needs of small volume and high integration, two requirements are put forward at present. On the one hand, the diameter of the wafer is required to gradually increase. In 2010, silicon wafers with a diameter of 450mm (18in) will be used, and the diameter of wafers will increase at a rate of 1.5 times every 9 years, and will develop to a large area. On the other hand, there is also a requirement, that is, it is hoped to increase t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L31/0352H01L31/036H01L31/18
CPCY02E10/50H01L31/02366Y02P70/50
Inventor 朱慧珑骆志炯尹海洲
Owner SUNOVEL SUZHOU TECH