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Device and method for measuring IR (infrared ray) normal emittance

A technology of normal emissivity and measurement device, applied in the field of infrared normal emissivity measurement device, can solve problems affecting accuracy, measurement, etc., and achieve the effect of high accuracy

Inactive Publication Date: 2011-06-15
NAT INST OF METROLOGY CHINA
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Problems solved by technology

The accuracy of the measurement results largely depends on the accuracy of the infrared normal emissivity value of the known standard sample, and it is impossible to directly measure the absolute value, which affects the accuracy of the measurement

Method used

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  • Device and method for measuring IR (infrared ray) normal emittance
  • Device and method for measuring IR (infrared ray) normal emittance
  • Device and method for measuring IR (infrared ray) normal emittance

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Embodiment Construction

[0035] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0036] figure 1 It is a structural block diagram of an infrared normal emissivity measuring device according to an embodiment of the present invention, comprising: a measurement module 1, a storage module 2 and a calculation module 3 connected in sequence,

[0037] The measurement module 1 is used to measure the signal data to be tested and the preset signal data of a standard black body with known infrared normal emissivity, and send the signal data to be tested and the preset signal data to the storage module, the preset signal data is the signal data measured when the standard blackbody with the known infrared normal emissivity is used as the measurement object, and th...

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Abstract

The invention discloses a device for measuring IR (infrared ray) normal emittance. The device comprises a measurement module, a storage module and a calculation module which are connected with each other in sequence, wherein the measurement module is used for measuring a to-be-measured signal data and preset signal data of a standard blackbody with a known IR normal emittance, and transmitting the to-be-measured signal data and the preset signal data to the storage module; the storage module is used for storing the to-be-measured signal data, the preset signal data and the IR normal emittance of the standard blackbody; and the calculation module is used for calculating the IR normal emittance of a sample to be measured according to the to-be-measured signal data, the preset signal data and the IR normal emittance of the standard blackbody. The IR normal emittance measurement device and the method provided by the invention can be used for directly measuring the IR normal emittance of the sample and measurement accuracy is high.

Description

technical field [0001] The invention relates to the technical field of emissivity measurement, in particular to an infrared normal emissivity measurement device and method. Background technique [0002] Currently known measuring instruments for infrared normal emissivity are all relative measurements, and the measurement process must rely on a standard sample with known normal emissivity. The accuracy of the measurement results depends largely on the accuracy of the infrared normal emissivity value of the known standard sample, and the absolute value cannot be directly measured, which affects the accuracy of the measurement. Contents of the invention [0003] (1) Technical problems to be solved [0004] The technical problem to be solved by the present invention is: how to provide a device and method that can directly measure the infrared normal emissivity and improve the measurement accuracy. [0005] (2) Technical solutions [0006] In order to solve the above technic...

Claims

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Application Information

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IPC IPC(8): G01N25/20G01J5/00
Inventor 冯国进郑春弟
Owner NAT INST OF METROLOGY CHINA
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