Function test system for SOC

Abstract

The invention provides a function test system for a system on chip (SOC). The function test system for the SOC comprises a test machine, a manipulator which is controlled by the test machine and used for testing a chip to be tested, a test sub board, and a test main board provided with a liquid crystal display. The test main board controls the test machine and the manipulator to work; the test sub board transmits state information of the current test item and test result information to the test main board through a serial port protocol; the test state information and the test result information comprise printed information and test item information; in the serial port protocol, the test item information is started with a pound sign-shaped character and ended with a star-shaped character, and the debugging printed information is not started with the pound sign-shaped character; the test main board transmits the final test result information of the chip to the manipulator through a test interface of the manipulator; and the manipulator counts the situation of finishing the chip test. The function test system can support manual tests and tests controlled by the manipulator; moreover, the test efficiency is high and the test cost is low.

Description

【Technical field】 [0001] The invention relates to a SOC function test system, which can support manual test and manipulator control test. 【Background technique】 [0002] SOC's Functional Test (Functional Test-FT) test is the last test before the product leaves the factory. It is required to carry out a functional test on the SOC, and screen out SOC chips with incorrect packaging and substandard performance (SOC is called a system-on-chip). [0003] How to effectively test the SOC chip is a problem that the academic circles, the industrial circles and various research institutes are trying to solve. In the prior art, a special test system is generally used to add a signal to the SOC to be tested, and then the corresponding output signal of the SOC is received from the corresponding output terminal of the SOC to judge whether the SOC chip is qualified. For example, use SCUD-1A, Agilent Technologies' 93000SOC test system and other widely used SOC test systems to test the func...

AI Technical Summary

Problems solved by technology

The test using this method is undoubtedly more accurate, but the disadvantages are also obvious. One is that the software development is relatively difficult, and the other is undoubtedly the high cost of testing. For this type of controller, the test may not be able to truly simulate the functions of the actual application

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