System for testing diode thermistor in high speed

A technology of thermistor and test system, applied in sorting and other directions, can solve the problems of narrow, only 15 ℃ to 30 ℃ temperature test, the test accuracy, labor intensity has not been improved, and the test device is small in size, etc. Achieve the effect of fast test speed, wide test temperature and compact structure

Active Publication Date: 2011-06-29
常州市科文传感器材料有限公司
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  • Abstract
  • Description
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  • Application Information

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Problems solved by technology

The test device used in this method is small in size and low in cost. Compared with the manual test method, the speed is slightly improved, and the output per person per shift is about 20,000 pieces, but the shortcomings of test accuracy and labor intensity have not been improved.
In addition, the operator has

Method used

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  • System for testing diode thermistor in high speed
  • System for testing diode thermistor in high speed
  • System for testing diode thermistor in high speed

Examples

Experimental program
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Embodiment 1）

[0068] See figure 1 , The diode-type thermistor high-speed test system of this embodiment includes a discharge device 1, a conveying device 2, a test device 3, a constant temperature tank 4, a receiving device 5, a lifting device 6, a machine base 7, a transmission mechanism and a control device. Discharging device 1 , conveying device 2 , testing device 3 , receiving device 5 , transmission mechanism and control device are arranged on machine base 7 . The constant temperature tank 4 and the lifting device are all located on the ground, and the constant temperature tank 4 is located at the middle and lower part of the support 7, and the constant temperature tank 4 is filled with oil during use. A left-right vertical mounting plate is provided on the lower side of the left-right middle part of the machine base 7 , and the mounting plate is located in the constant temperature tank 4 . The discharge device 1 includes a discharge magnetic track 11 and a discharge magnetic wheel 1...

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Abstract

The invention provides a system for testing a diode thermistor in a high speed. The system comprises a material discharging device, a conveying device, a test device, a constant-temperature slot, a material receiving device, a lifting device, an engine seat, a transmission mechanism and a control device; the material discharging device, the conveying device, the test device, the material receiving device, the transmission mechanism and the control device are all arranged on the engine seat; the lifting device and the engine seat are arranged on the floor and the constant-temperature slot is formed on the floor; the material discharging device comprises a material discharging magnetic rail and a material discharging magnetic wheel; the conveying device comprises a chain wheel device, two material discharging chains, a conveying pipe, a feeding magnetic rail, a first stopping device, a second stopping device and a guide block; the test device comprises a test magnetic wheel, a tester and a probe; and the material receiving device comprises a stepping wheel, a material receiving box and a poking sheet. The system is used for testing the diode thermistor, and has high test speed and high stepping precision.

Description

technical field [0001] The invention relates to a testing and sorting device for thermistors. Background technique [0002] For a long time, people have relied on manual or semi-automatic testing methods to test diode thermistors. [0003] The manual test method is to use a resistance meter, put the diode-type thermistors into the constant temperature bath, and take them out one by one for testing. This method has high labor intensity and low efficiency. One person can test about 10,000 pieces per shift. Each person has a constant temperature bath and tester, which consumes a lot of electricity, has low equipment utilization, occupies a lot of land, and costs high for testing. Moreover, the temperature measurement range of this method is narrow, and the test above 50°C and below 15°C cannot be carried out. Due to the large influence of human factors, the error rate is high. In addition, the operator faces the hot oil used for constant temperature at close range for a long ...

Claims

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Application Information

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IPC IPC(8): B07C5/344B07C5/02B07C5/38
Inventor 倪伟文
Owner 常州市科文传感器材料有限公司
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