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Visibility measuring method based on atmospheric fine particle spectrometer

A fine particle, visibility technology for environmental science applications

Inactive Publication Date: 2011-09-14
ANHUI INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

For different regions, although the composition of pollutant particles is different; however, for a specific city or region, there is no report on what particle size affects and determines the level of visibility.

Method used

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  • Visibility measuring method based on atmospheric fine particle spectrometer
  • Visibility measuring method based on atmospheric fine particle spectrometer
  • Visibility measuring method based on atmospheric fine particle spectrometer

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Embodiment Construction

[0026] In view of the fact that regional atmospheric compound pollution is becoming more severe, and the increase of atmospheric fine particle pollution in the urban environment directly leads to the reduction of atmospheric visibility, the atmospheric visibility is directly analyzed from the perspective of fine particle spectrum distribution in the atmosphere, and the invention based on atmospheric fine particle The spectrometer visibility measurement method, elaborated its working principle, realized the atmospheric visibility measurement based on the atmospheric fine particle spectrometer data, and has been successfully applied to the measurement and analysis of atmospheric visibility in different regions.

[0027] The method of the present invention adopts the particle size distribution and particle number concentration distribution data obtained by measuring the atmospheric fine particle spectrometer, and obtains the total extinction cross section of particles with differen...

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Abstract

The invention discloses a visibility measuring method based on an atmospheric fine particle spectrometer. The method comprises the following steps of: directly analyzing the atmospheric visibility from the angle of fine particle spectrum distribution in the atmosphere; and obtaining the atmosphere visibility according to the particle size distribution and the particle population concentration measured by the atmospheric fine particle spectrometer by analyzing the total extinction contribution of different sizes of particles to visible light. The method is simple, can realize atmospheric fine particle size distribution, particle population concentration distribution and the atmospheric visibility as well as contribution rate and distributed measurement of different sizes of particles to the atmospheric visibility by means of only the atmospheric fine particle spectrometer, has objective, accurate and reliable measurement results, ensures that the measurement process is not influenced by weather conditions (rain, fog, haze, sand and dust, and the like) and no target and background reference substances are required as references, and is easy to operate because instruments are installed and maintained indoors.

Description

technical field [0001] The invention relates to the field of environmental science, in particular to the measurement of atmospheric visibility, in particular to a visibility measurement method based on an atmospheric fine particle spectrometer. Background technique [0002] The continuous acceleration of industrialization and urbanization has led to more severe regional air pollution. One of the prominent common problems faced by key cities is the reduction of atmospheric visibility, which is also the focus of governments and many researchers. Existing research results have shown that the increase in atmospheric fine particle pollution in cities is the direct cause of reduced visibility. Some researchers have analyzed the relationship between visibility and the particle size distribution and optical thickness of aerosol particles; but more researchers Statistical analysis was conducted on the correlation between visibility and PM10, PM2.5 or PM1, and it was pointed out that ...

Claims

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Application Information

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IPC IPC(8): G01N15/02
Inventor 赵南京刘建国刘文清陆亦怀张玉钧刘诚董云升张天舒谢品华
Owner ANHUI INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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