Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Time sequence database testing method and system

A time series and test method technology, applied in the fields of electrical digital data processing, special data processing applications, instruments, etc., can solve the problems of inability to evaluate the function and performance of different time series databases, occupancy, and inability to compare and analyze different time series databases.

Inactive Publication Date: 2011-11-23
ELECTRIC POWER RES INST OF GUANGDONG POWER GRID +1
View PDF4 Cites 9 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] Time-series database, as the core advanced basic application technology in the computer field, is a complex system engineering integrating algorithm, implementation, tools and maturity. Foreign time-series database manufacturers have occupied the market through long-term market-oriented operation. The time-series database has made great progress in theory and practice. However, the time-series databases developed and produced by different manufacturers are different, and the types of information data contained are also different, so it is impossible to directly analyze the different time-series databases. The comparison and analysis of different time series databases of different manufacturers makes it impossible to evaluate and select the functions and performance of different time series databases of different manufacturers

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Time sequence database testing method and system
  • Time sequence database testing method and system
  • Time sequence database testing method and system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0013] The solutions of the present invention are described in detail below in the form of specific examples.

[0014] see figure 1 Shown is a schematic flow diagram of an embodiment of the time series database testing method of the present invention, which includes steps:

[0015] Step S101: Set the type of test point to be tested, the type of test point includes function index, advanced function index, performance index, enter step S102;

[0016] Step S102: Test the above test point types respectively, and record the test results of each test point type.

[0017] According to the above-mentioned scheme of the present invention, it sets the test point types that need to be tested, and tests the time series database according to these test point types. Since the set test point types are important items for evaluating the time series database, they are different. The time series database produced by the manufacturer is tested based on the same test point type, so that not onl...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a time sequence database testing method and system. The method comprises the following steps: setting test point types to be tested, wherein the test point types comprise a function index, an advanced function index, a performance index and availability; and testing the test point types respectively, and recording the test results of testing on each test point type. According to the scheme of the invention, the functions and performance of the time sequence database can be comprehensively tested, and the functions and performances of time sequence databases of different manufacturers can be compared conveniently, and the model selection of the time sequence database is facilitated.

Description

technical field [0001] The invention relates to a time series database testing method and a time series database testing system. Background technique [0002] Time-series database, as the core advanced basic application technology in the computer field, is a complex system engineering integrating algorithm, implementation, tools and maturity. Foreign time-series database manufacturers have occupied the market through long-term market-oriented operation. The time-series database has made great progress in theory and practice. However, the time-series databases developed and produced by different manufacturers are different, and the types of information data contained are also different, so it is impossible to directly analyze the different time-series databases. The comparison and analysis of different time series databases of different manufacturers cannot evaluate and select the functions and performances of different time series databases of different manufacturers. Cont...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/30
Inventor 温柏坚陈炯聪周伊琳谢善益卢建刚徐展强曾坚永周强峰
Owner ELECTRIC POWER RES INST OF GUANGDONG POWER GRID
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com