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Three-dimensional digital image correlation (3D-DIC) correcting method

A correction method and three-dimensional digital technology, which are applied to measuring devices, instruments, and optical devices, etc., can solve the problems of deepening difficulty and difficulty in implementing the swing correction sheet 6, and achieve the effects of low cost and easy production.

Active Publication Date: 2013-10-23
NATIONAL TSING HUA UNIVERSITY
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  • Description
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  • Application Information

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Problems solved by technology

However, for the application on these large-scale buildings, because the image capture devices 1 and 2 must be installed at a considerable distance from the object under test 5, it is difficult to implement the swing correction sheet 6
In addition, for the measurement of microscopic dimensions (such as millimeters and microns), the size of the calibration test piece is relatively small, which will greatly increase the difficulty of swinging the regular piece.

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  • Three-dimensional digital image correlation (3D-DIC) correcting method

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Embodiment Construction

[0020] The following description and examples are used to explain the details of the present invention. However, those skilled in the art should easily understand that under the coverage of the embodiments of the present invention, there should be considerable changes and improvements to the above-mentioned embodiments. Therefore, the following embodiments are not intended to limit the protection scope of the present invention.

[0021] Relevant detailed description and technical contents of the present invention, now cooperate with accompanying drawing to illustrate as follows:

[0022] image 3 A schematic diagram showing a model of a three-dimensional digital image correlation system; it includes the first image capture device 1 and the second image capture device 2, wherein the lens center of the first image capture device 1 is set on a device coordinate axis (x 1 ,y 1 ,z 1 ), and the lens center of the second image capture device 2 is set on another device coordinate...

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Abstract

The invention relates to a three-dimensional digital image correlation (3D-DIC) correcting method. The method comprises the following steps of: providing a 3D-DIC system; providing a correction sheet, and fixedly arranging the correction sheet at a position which is the same as that of an object to be detected; performing a system correction program; simultaneously swinging a first image acquisition device and a second image acquisition device which serve as the same unit to acquire a plurality of correction images of the correction sheet, wherein each correction image comprises a plurality of identical circular points on the correction sheet, and gaps among the circular points are the same as one another and are preset; and computing a plurality of system parameters by using the gaps, wherein the system parameters are applied in measurement and operation of the object to be detected. In the invention, the correction sheet is not required to be swung, so that the method can be suitable for a correction program with a longer distance and a wider range.

Description

technical field [0001] The present invention relates to a correction method of a three-dimensional digital image correlation method; in particular, it relates to a correction method of a three-dimensional digital image correlation method that does not need to swing a correction sheet, so it is suitable for microscopic measurement or a long distance, a wide range, and does not need to limit the rigidity of the correction sheet . Background technique [0002] With the advancement of various technologies, measurement technology has been widely used in the accuracy verification of industrial manufacturing and civil engineering. According to whether it is in contact or not, measurement techniques can be divided into contact and non-contact. Among them, contact measurement technology is limited in application because of its long measurement time and destructiveness; non-contact measurement, such as ultrasonic Measurement and optical measurement are widely used because of their fa...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/00G01B11/16G01B11/24
Inventor 王伟中何义杰陈柏甫
Owner NATIONAL TSING HUA UNIVERSITY