Laser multi-parameter real-time measuring device
A technology of laser parameters and measuring devices, which is applied in the direction of testing optical properties, etc., can solve the problem of not being able to fully reflect the multi-faceted state of the measured laser beam, and achieve the effect of real-time measurement and monitoring
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Embodiment 1
[0023] Such as figure 1 As shown, it is a schematic structural diagram of an embodiment of a laser multi-parameter real-time measurement system embodiment of the present invention, which includes a measured laser light source 1; a spectroscopic device 2 that is arranged behind the measured laser light source 1 and is used to distribute laser light to each measuring device; A control device 3 for controlling the spectroscopic device 2 and each measuring device; a frequency domain related parameter measurement device 4; a time domain related parameter measurement device 5; a space related parameter measurement device 6; an energy / power related parameter measurement device 7; Parameter measuring device 8; set behind each measuring device, used to collect the measurement results of each measuring device, and perform data processing and statistical measurement parameter comprehensive processing device 9; set after the measurement parameter comprehensive processing device 9, for disp...
Embodiment 2
[0026] Such as figure 2 As shown, it is a schematic structural diagram of an embodiment of a laser multi-parameter real-time measurement system embodiment of the present invention, which includes a measured laser light source 1; a spectroscopic device 2 that is arranged behind the measured laser light source 1 and is used to distribute laser light to each measuring device; A control device 3 for controlling the spectroscopic device 2 and each measuring device; a frequency domain related parameter measuring device 4; a time domain related parameter measuring device 5; an energy / power related parameter measuring device 7; The measurement results of each measuring device are used for data processing and statistical measurement parameter comprehensive processing device 9; the display device 10 is arranged behind the measurement parameter comprehensive processing device 9 and is used to display the measurement results.
[0027] Among them, the measured light source 1 can be any co...
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