Method for optimizing reliability of harmonic gear used for space vehicle based on fault physics

A technology of harmonic gear and fault physics, applied in special data processing applications, instruments, electrical digital data processing, etc., can solve the problem of difficult to determine the main failure mode and functional function of the system, shorten the product design cycle and reduce the launch cost. , the effect of reducing the cost of product development

Inactive Publication Date: 2012-03-28
UNIV OF ELECTRONICS SCI & TECH OF CHINA
View PDF2 Cites 22 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

In this patented technical effect that uses advanced mathematical techniques such as Failure Physics Analysis (FE) or Finite Element Method (FinE), we developed an algorithm called Quantum Optimization Algorithm(QOAG). It allows us to predict how well certain parts will fail during use without having them actually break down over time. By combining these predictions with physical experiments like Fluid Dynamics Experimentation (FDX) data from different locations around our planet, researchers were able to identify which part was most likely affected first. Overall, QoGAA improves the quality control process and reduces manufacturings costs while also enhancing its overall performance capabilities.

Problems solved by technology

Technological Problems addressed in this patented technical problem include improving the efficiency and lifespan (the number of hours) of mission critical equipment systems, particularly when compared to other types of structures. Specifically, current methods involve optimizing specific parts called "gutters," which can reduce stress levels over longer periods without increasing their size. However, these techniques may result in insufficiently long durations during flight operations where the payload needs to stay within acceptable limits. To address this issue, some companies propose solutions involving analyzing failures caused by different sources including temperature fluctuate, moisture content, impact force, vibration, etc., making them easier to identify root causes beforehand. Additionally, while previous designs were mostly static ones, dynamic simulations showed that the use of harmonics could improve upon safety measures against damage from external forces.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for optimizing reliability of harmonic gear used for space vehicle based on fault physics
  • Method for optimizing reliability of harmonic gear used for space vehicle based on fault physics
  • Method for optimizing reliability of harmonic gear used for space vehicle based on fault physics

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018] Now in conjunction with embodiment, accompanying drawing, the present invention will be further described: a kind of reliability optimization method of harmonic gear used in spacecraft based on failure physics, comprises the following steps:

[0019] Step 1: Establish the physical model of the harmonic gear for spacecraft according to the structural characteristics of the harmonic gear for spacecraft.

[0020] In this embodiment, the physical model of the harmonic gear for spacecraft is as follows figure 1 As shown, the harmonic gear for spacecraft is mainly composed of three basic components: wave generator 1, flexible spline 2 and rigid spline 3.

[0021] Step 2: According to the physical model of the harmonic gear for spacecraft obtained in step 1, use the reliability simulation technology based on fault physics to determine the underlying fault information of the harmonic gear for spacecraft.

[0022] In this step, if figure 2 As shown, the reliability simulation...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a method for optimizing reliability of a harmonic gear used for a space vehicle based on fault physics. The method comprises the following steps: 1) establishing a physical model of the harmonic gear used for the space vehicle; 2) confirming bottom fault information of the harmonic gear used for the space vehicle; 3) analyzing and acquiring a key part of the harmonic gearused for the space vehicle and a main failure mode thereof; 4) confirming a response surface function of the main failure mode; 5) converting a strength restrain and a fatigue restrain in design optimization of the harmonic gear used for the space vehicle into reliable restrains; and 6) establishing a function expression of the volume of the harmonic gear used for the space vehicle and taking thefunction expression as an optimizing target function. The method provided by the invention has the beneficial effects that the method can be used for performing quantitative optimization of the reliability and ensuring the reliability while efficiently reducing the weight of a product, thereby lowering launching cost.

Description

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products