Automatic experimental device and method for reliability growth test of embedded software
An embedded software, automatic test technology, applied in software testing/debugging and other directions, can solve the problems of inability to obtain test data, save test time and test energy, and inability, to reduce test time, reduce tester energy, and improve testing. The effect of efficiency
Inactive Publication Date: 2012-04-04
BEIHANG UNIV
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Problems solved by technology
Not only is it impossible to automatically execute software reliability testing with high efficiency to save testing time and effort, but it is also impossible to obtain a large amount of test data for software reliability research
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[0032] In order to facilitate those of ordinary skill in the art to understand and implement the present invention, the present invention will be further described in detail and in-depth below in conjunction with the accompanying drawings.
[0033]The automatic test device and method for the reliability growth test of embedded software of the present invention are based on the idea of defect injection to the software under test, and the basic idea is that the corresponding test platform separates the input stimulus in it by analyzing the test script Get relevant signals, interact with the tested software through the hardware interface, and collect the test-related information fed back by the tested software, and then judge according to the preset conditions. If defects are found, they will be automatically eliminated to realize the reliability growth test process. The typical embedded software developed based on the host computer is used as the software under test. This softw...
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The invention provides an automatic experimental device and an automatic experimental method for the reliability growth test of embedded software. An automatic test platform of the device is connected with embedded test software through a recommended standard (RS) 422 serial port wire and crossed network wires; the automatic test platform issues a defect configuration file, converts and analyzes test cases, and collects test output and operation information; and with the embedded test software, the injection of defects and information acquisition in the operation process of the software are realized. The method comprises the following steps of: injecting the defects by using the defect configuration file; converting and analyzing the test cases by using the automatic test platform, and thus obtaining test input excitation and test auxiliary information; controlling the embedded test software to operate; and collecting the test output and operation information, and automatically eliminating the defects when the defects are discovered to realize a reliability growth test process. By the invention, the automatic experiment for the reliability growth test of the embedded software is realized, test time is greatly shortened, and the energy of a tester is greatly reduced, so that test data which is required by a research can be more easily collected.
Description
technical field [0001] The invention is applied to the field of reliability testing of embedded software, and in particular relates to an automatic testing device and method for reliability growth testing of embedded software. Background technique [0002] With the widespread application of embedded systems in civil, industrial and national defense fields, embedded software plays an increasingly important role. Since the failure of embedded software will lead to system failure, economic losses and even major accidents, it has aroused widespread concern, so it is of great significance to improve the reliability of embedded software. [0003] Software reliability testing, especially embedded software reliability testing, is an extremely time-consuming and labor-intensive testing process. Only when the test samples (test data) are very rich, the test data generated by random sampling can more accurately reflect the distribution of software usage, but the increase of test data ...
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Inventor 艾骏钟芳凌敖麒郑峰陆民燕尚京威
Owner BEIHANG UNIV