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Semiconductor integrated circuit device

一种集成电路、半导体的技术，应用在半导体器件、电路、半导体/固态器件零部件等方向，能够解决识别错误等问题

Inactive Publication Date: 2012-04-04
CANON KK
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, even when a circuit is protected using the technique described in Japanese Patent Laid-Open No. 2006-012159, if a FIB device is used to deposit wiring metal so as to bypass a portion to be analyzed and apply a predetermined voltage, then There is also a possibility of causing identification errors, that is, there is a possibility of causing the definite operation of the detection circuit to detect a normal state instead of an abnormal state

Method used

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  • Semiconductor integrated circuit device
  • Semiconductor integrated circuit device
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Embodiment Construction

[0016] Embodiments of the present invention will be described below with reference to the drawings. will now refer to figure 1 A configuration example of the semiconductor integrated circuit device 100 according to the embodiment of the present invention is explained. The semiconductor integrated circuit device 100 may include a storage circuit 102 , a control circuit 103 , a processing circuit 108 , and a detection circuit 104 formed over a semiconductor substrate 101 . The storage circuit 102 may include at least one of a nonvolatile memory and a volatile memory, and hold data. The control circuit 103 is, for example, a CMOS logic circuit, and can control access of the processing circuit 108 to data held in the storage circuit 102 . That is, the control circuit 103 can control the writing of data to the storage circuit 102 through the processing circuit 108 and the reading of data from the storage circuit 102 through the processing circuit 108 . The processing circuit 108...

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Abstract

The present invention provides a semiconductor integrated circuit device comprising: a circuit block formed on a semiconductor substrate; an electrically conductive pattern formed in an upper layer of a portion to be protected of the circuit block; an oscillation circuit connected to the electrically conductive pattern, and configured to oscillate at an oscillation frequency determined by a circuit constant of the electrically conductive pattern; and a detection circuit configured to determine whether a preset range includes the oscillation frequency of the oscillation circuit.

Description

technical field [0001] The present invention relates to semiconductor integrated circuit devices. Background technique [0002] There have been demands to protect circuits mounted on semiconductor integrated circuit devices for holding data requiring high security, such as personal information, from physical alteration and analysis. In the semiconductor integrated circuit device described in Japanese Patent Laid-Open No. 2006-012159, wiring lines are formed on circuits to be protected. Upon detecting a change in voltage of the wiring line, the detection circuit of the semiconductor integrated circuit device determines that the wiring line has been altered. However, focused ion beam (FIB) devices have recently become available. When using the FIB apparatus, it is possible to cut wiring lines by emitting ion beams from the front surface of the semiconductor integrated circuit device, and deposit wiring metals. Therefore, even when a circuit is protected using the technique ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H03L7/099H01L23/58H01L23/522G06F21/75G06F21/86
CPCH01L23/576H03K5/19H01L23/585H03K3/0315H01L2924/0002G06F21/87H01L2924/00
Inventor 大村昌伸
Owner CANON KK
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