Apparatuses and methods for identification of external influences on at least one processing unit of embedded system

Abstract

The present invention relates to the identification of external influences on at least one processing unit in a set of processing units in an embedded system. In this case, an arrangement which is configured for this purpose has: a data generator which is configured to generate data which is designed to identify external influences on at least one processing unit in the set of processing units; a sensor circuit which has a set of electronic elements, wherein the electronic elements are configured to store data, wherein the sensor circuit is configured to transmit the data to a data checker by sequential buffer storage of the data in the electronic elements; the data checker, which is configured to check the correctness of the data. The present invention allows improved identification of external influences on at least one processing unit in an embedded system. It is applicable to embedded systems.

Description

technical field [0001] The invention relates to identifying external influences on at least one processing unit of an embedded system. In particular, the invention relates to a device, a method and a data unit configured or constructed to detect external influences on at least one processing unit of an embedded system. Furthermore, the invention relates to an embedded system having a device for detecting external influences on at least one processing unit of the embedded system. Background technique [0002] When building an embedded system, one, two or more processing units or components (such as channels in a multiprocessor configuration, main processor, etc.) are placed on a chip. Here, the processing unit or component is a unit or component of an embedded system. In order to ensure the safe and / or reliable running and / or operation of such embedded systems, the results of the processing units or components of the embedded system are compared with each other by correspon...

AI Technical Summary

Problems solved by technology

Thus, for example, a hot spot may, for example after a short circuit in a channel, also affect the other channel through semiconductors or other components due to thermal coupling

Also, "Stuck-at-Fehler" at a signal passing from one lane to another can damage parts of the circuitry in another core processor (eg due to overloading)

Also, a hot spot in an output driver in one core processor can negatively affect another core processor through an off-chip short

[0006] Hitherto known approaches for identifying such extraneous or external influences on processing units or components in embedded systems have a number of disadvantages

Its implementation is often expensive and / or costly

In addition, the known procedures for detecting such foreign or external influences often lack or are insufficiently independent, ie lack or are insufficient in terms of strategies for increasing failure safety.

Furthermore, the previous approach had only a lacking or completely insufficient safety-technical effect in embedded systems etc.

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