Data query method and tool
A data query and data technology, applied in the field of data processing, can solve the problems of complex query process and easy induction errors, and achieve the effect of simplifying operation steps, simple and fast query process, and high accuracy.
Inactive Publication Date: 2012-05-30
ANYKA (GUANGZHOU) MICROELECTRONICS TECH CO LTD
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Problems solved by technology
[0003] Although the query function of CQ is very powerful, it lacks an overall summary of defects, such as the number of bugs (vulnerabilities, defects) submitted on the day, the number of unallocated bugs on the day, the total number of bugs, and the total number of unresolved bugs The number of bugs, the total number of unassigned bugs, etc., these data have played a great role in the decision-making of the work in the daily work or the deployment of future work
[0004] In order to obtain the overall summary data of the above data, it is necessary to perform complex query settings for each item in the CQ, and manual participation is required. The query process is complex and prone to induction errors
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[0039] The embodiment of the present application provides a data query method and tool, aiming at the lack of an overall induction process of data in the CQ query system in the prior art, and in order to obtain the overall induction data of the above data, it is necessary to carry out a complex process for each item in the CQ According to the current situation of the query setting, the embodiment of the present application provides a new data query method and tool, which sets the data filtering conditions for the data in the defect database, defines the data storage process according to the filtering conditions, and directly queries the data in the defect database. Effectively obtain the query data required by users, the query process is simple and fast, and the query efficiency is high.
[0040] In order to enable those skilled in the art to better understand the scheme of the present application. The following will clearly and completely describe the technical solutions in t...
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The invention discloses a data query method which comprises the following steps: setting data screening conditions and defining a data storage process according to the data screening conditions; establishing a data connection relation with a defect database; and querying the data in the defect database by using the defined data storage process. According to the data query method provided by the invention, the data screening conditions are set and the data storage process is defined according to the screening conditions, wherein a query command which is programmed by SQL (structured query language) statements is configured in the data storage process; in no need of the current defected management tool, the connection with the defect database on which a background operation system of the defect management tool depends is established directly and the data in the defect database can be queried by the query command; the whole query process is simple and fast without manual operation, the accuracy and the query efficiency are high, the operation of configuring the query process of each project in a CQ is avoided, thereby effectively simplifying the operation steps.
Description
technical field [0001] This application relates to the field of data processing, in particular to a data query method and tool. Background technique [0002] CQ is a defect and change tracking system that organizes and automates the processes associated with submitting, assigning, tracking, testing and releasing change requests. [0003] Although the query function of CQ is very powerful, it lacks an overall summary of defects, such as the number of bugs (vulnerabilities, defects) submitted on the day, the number of unallocated bugs on the day, the total number of bugs, and the total number of unresolved bugs The number of bugs, the total number of unassigned bugs, etc. These data play a great role in the decision-making of the work in daily work or the deployment of future work. [0004] In order to obtain the overall generalized data of the above data, it is necessary to perform complex query settings for each item in the CQ, and manual participation is required. The quer...
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Inventor 易利娜王瑛张辉胡胜发
Owner ANYKA (GUANGZHOU) MICROELECTRONICS TECH CO LTD