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Performance evaluation experiment analysis method for photo-electric imaging system

A system performance evaluation, photoelectric imaging technology, applied in the direction of electrical digital data processing, special data processing applications, instruments, etc., can solve the problems of difficult determination and quantitative determination of factors affecting the detection and recognition performance of photoelectric imaging systems and the degree of influence

Active Publication Date: 2012-07-11
SHENYANG INST OF AUTOMATION - CHINESE ACAD OF SCI
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Problems solved by technology

[0004] Aiming at the deficiencies existing in the photoelectric imaging system in the prior art, which are susceptible to various external factors and internal factors, and are difficult to qualitatively and quantitatively determine the influencing factors and the degree of influence on the detection and recognition performance of the photoelectric imaging system, the technical problems to be solved by the present invention It provides an experimental analysis method for evaluating the performance of the photoelectric imaging system that can determine the order of the influencing factors affecting the photoelectric imaging system and the degree of influence

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  • Performance evaluation experiment analysis method for photo-electric imaging system
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Embodiment Construction

[0023] like figure 1 As shown, the photoelectric imaging system performance evaluation experimental analysis method of the present invention comprises the following steps:

[0024] Establish a performance prediction model for optoelectronic imaging systems;

[0025] Divide the input factor set and the output indicator set in the performance prediction model;

[0026] Perform screening experiments on input factor sets;

[0027] According to the screening experiment results, the model input factor levels are divided, and the model input factor level table is established;

[0028] According to the model input factor level table, select the orthogonal table to form the experimental plan;

[0029] Call the performance prediction model to calculate the output index set corresponding to each experimental plan;

[0030] Use the output index set to carry out range analysis and sensitivity analysis, and end the experimental analysis process.

[0031] The method is implemented based...

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Abstract

The invention relates to a performance evaluation experiment analysis method for a photo-electric imaging system, which includes the following steps: building a photo-electric imaging system performance prediction model; dividing input factor sets and output index sets in the photo-electric imaging system performance prediction model; conducting screening experiment on the input factor sets; dividing input factor levels of the model according to screening experiment results and building a model input factor level graph; selecting orthogonal graphs according to the model input factor level graph to form experiment schemes; invoking the performance prediction model to calculate the output index sets corresponding to each experiment scheme; and performing range analysis and sensitivity analysis by aid of the output index sets and finishing the experiment analysis process. The performance evaluation experiment analysis method for the photo-electric imaging system can compteltely, typically and equilibrium comparably reflect effects of all experiment input factors on experiment indexes with the fewest experiment times, analyzes and determines the optimum level of all the experiment input factors and primary and secondary relations of all the experiment input factors in effects on the output indexes through a range method, and simultaneously analyzes the sensitivity degree of the input factors on the output indexes through a sensitivity analysis method.

Description

technical field [0001] The invention relates to the technical field of performance evaluation of a photoelectric imaging system, in particular to an experimental analysis method for performance evaluation of a photoelectric imaging system. Background technique [0002] The performance prediction model of optoelectronic imaging system is an important aspect of research and improvement of optoelectronic imaging system, involving scene modeling, atmospheric optics, optical engineering, information processing, visual physiology, etc. , by establishing a prediction model for the detection and recognition capability of the photoelectric imaging system, the analysis and evaluation of the performance and influencing factors of the photoelectric imaging system are realized. [0003] The imaging quality of the photoelectric imaging system is affected by multiple factors such as the external natural environment, the test conditions of the target scene, and the imaging system's own opti...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F19/00
Inventor 赵怀慈刘海峥郝明国花海洋王立勇
Owner SHENYANG INST OF AUTOMATION - CHINESE ACAD OF SCI
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