Method and system for measuring maximum time interval error
A time interval error and interval error technology, applied in the measurement method and system field of the maximum time interval error, can solve the problems of high cost, cumbersome calculation method, long calculation time, etc., achieve simple calculation method, shorten calculation time, and speed up The effect of computing speed
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Publication Date
- 2012-07-11
- Estimated Expiration
- Not applicable · inactive patent
Smart Images
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Abstract
Description
technical field
[0001] The invention relates to the technical field of communication, in particular to a method and system for measuring the maximum time interval error. Background technique
[0002] In measurement and control systems and communication networks, the timing and synchronization of time scale signals are often involved. There are many parameters for the stability evaluation of time-stamp signals used for timing and synchronization in these systems. The use of MTIE (Maximum time interval error, maximum time interval error) to evaluate the stability of time-scale signals has attracted people's attention. Usually MTIE is used to describe the maximum value, phase transient and long-term frequency deviation of a timing signal within a certain observation time. This parameter is indispensable no matter in the performance test of synchronous equipment and synchronous network interface, or in other related tests of transmission performance test.
[0003] The test of...
Examples
Embodiment Construction
[0048] It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0049] refer to figure 1 , propose an embodiment of the measuring method of MTIE of the present invention, this method comprises:
[0050] Step S101, connecting the clock under test to a reference clock source, sampling the time interval error between the clock under test and the reference clock source, and exporting the collected time interval error data;
[0051] Connecting the measured clock to a reference clock source, sampling the time interval error between the measured clock and the reference clock source, and exporting the collected data of the time interval error;
[0052] In this embodiment, the data of TIE (Time interval error, time interval error) can be sampled by an oscilloscope, and the collected data of TIE can be exported, so as to perform MTIE (Maximum time interval error) according to the data of T...