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Method and system for measuring maximum time interval error

A time interval error and interval error technology, applied in the measurement method and system field of the maximum time interval error, can solve the problems of high cost, cumbersome calculation method, long calculation time, etc., achieve simple calculation method, shorten calculation time, and speed up The effect of computing speed

Inactive Publication Date: 2012-07-11
ZTE CORP
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Problems solved by technology

However, using SDH test equipment to test the MTIE index makes the cost of the test higher, and the existing calculation method is more cumbersome, which makes the calculation time longer

Method used

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  • Method and system for measuring maximum time interval error
  • Method and system for measuring maximum time interval error
  • Method and system for measuring maximum time interval error

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Embodiment Construction

[0048] It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0049] refer to figure 1 , propose an embodiment of the measuring method of MTIE of the present invention, this method comprises:

[0050] Step S101, connecting the clock under test to a reference clock source, sampling the time interval error between the clock under test and the reference clock source, and exporting the collected time interval error data;

[0051] Connecting the measured clock to a reference clock source, sampling the time interval error between the measured clock and the reference clock source, and exporting the collected data of the time interval error;

[0052] In this embodiment, the data of TIE (Time interval error, time interval error) can be sampled by an oscilloscope, and the collected data of TIE can be exported, so as to perform MTIE (Maximum time interval error) according to the data of T...

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Abstract

The invention discloses a method for measuring a maximum time interval error. The method comprises the following steps of: connecting a tested clock with a reference clock, sampling a time interval error between the tested clock and the reference clock, and exporting data of the acquired time interval error; and processing the data of the time interval error by adopting a matrix algorithm to obtain a maximum time interval error, and drawing a maximum time interval error curve graph. The invention further provides a measuring system which comprises a testing device, a tested clock and a reference clock source. Due to the adoption of the method and the device for measuring the maximum time interval error, phase variation is analyzed by using an improved computing method of the maximum time interval error, the testing cost is well lowered, the computing method is simple, and computing time can be greatly shortened.

Description

technical field [0001] The invention relates to the technical field of communication, in particular to a method and system for measuring the maximum time interval error. Background technique [0002] In measurement and control systems and communication networks, the timing and synchronization of time scale signals are often involved. There are many parameters for the stability evaluation of time-stamp signals used for timing and synchronization in these systems. The use of MTIE (Maximum time interval error, maximum time interval error) to evaluate the stability of time-scale signals has attracted people's attention. Usually MTIE is used to describe the maximum value, phase transient and long-term frequency deviation of a timing signal within a certain observation time. This parameter is indispensable no matter in the performance test of synchronous equipment and synchronous network interface, or in other related tests of transmission performance test. [0003] The test of...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04B17/00H04J3/06
Inventor 邹艺伟
Owner ZTE CORP
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