Analog accumulator capable of implementing time delay integration (TDI) function inside complementary metal-oxide semiconductor (CMOS) image sensor
A technology of image sensor and accumulator, applied in the field of analog accumulator
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[0030] The circuit diagram of the analog accumulator reference image 3 , which mainly includes: sampling capacitor Cs, fully differential operational amplifier, two input buses, two output buses, n+1 sets of integrators, and the voltage source Vos is used to represent the input offset voltage of the operational amplifier. The CMOS-TDI image sensor adopts a drum-type exposure with an oversampling rate of (n+1) / n to realize the synchronization of exposure of different rows of pixels to the same object. The so-called drum exposure with an oversampling rate of (n+1) / n means that within one exposure period, the exposure is started successively from the pixels in the first row to the pixels in the nth row, and then the first row is added to the exposure start, so that in one exposure period The inner n rows of pixels will output n+1 data. The corresponding relationship between n rows of pixels in the pixel array and n+1 sets of integrators in the accumulator is as follows Figure...
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