Novel bidirectional reflectance distribution function measuring device

Abstract

The invention discloses a novel bidirectional reflectance distribution function measuring device. A light source 1 is fixed and illuminates perpendicularly and downwards, a sample supporting component is a six-axis manipulator, a probe rotation driving unit 5 drives a detector probe 2 to rotate semi-circularly in a vertical plane above a horizontal plane, the six-axis manipulator 3 is combined with a perpendicular rotating device, a sample 4 and a detector move in a combination manner, the pointing direction and the azimuth angle of a normal line of the illuminated sample and the pointing direction of the detector probe are changed, and incident light and a detection direction in a hemisphere space are accurately positioned relative to the center azimuth angle and the pitch angle of the sample.

Description

technical field [0001] The invention belongs to a novel bidirectional reflection distribution function (BRDF) measuring device in the field of optics. Specifically, through a six-axis manipulator and a vertical rotary motion mechanism, combined with a vertical or horizontal fixed light source, the measurement of the bidirectional reflection distribution function of objects within the hemispherical space range is realized. installation. Background technique [0002] The bidirectional reflectance distribution function (BRDF) of an object is obtained by measuring the spectral reflectance of the object in different incident directions and detection directions within the space hemisphere. The spectral reflectance of the object represents the inherent properties of the object. By measuring the spectral reflectance of the object, we can A lot of useful information can be extracted from objects. Therefore, it has a wide range of applications in the fields of industry and commerce, r...

AI Technical Summary

Problems solved by technology

[0009] At present, the existing BRDF measurement device is a horizontal and vertical double-arc orbit to realize the change of detection azimuth and zenith angle within the hemisphere. The limitations of the equipment are reflected in the shading of the arc orbit which affects its measurement results and the machining accuracy of the arc orbit. The positioning accuracy affecting the angle of the device is not high, which leads to high measurement uncertainty of the measurement system

Therefore, the existing measurement methods and means can no longer meet the needs of the current measurement of the scattering characteristics of the surface of objects, and it is necessary to further develop a new type of measurement device to meet the existing measurement needs and improve the measurement level of optical diffuse reflection characteristics in my country.

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