Instrument amplifier calibration method, system and device

A technology of instrument amplifiers and transimpedance amplifiers, which is applied in the direction of amplifiers, differential amplifiers, amplifiers with semiconductor devices/discharge tubes, etc., can solve the problems of test mode logic and interface/multiplexing circuit complexity, and achieve reduction Effect of Die Area

Active Publication Date: 2016-02-17
MICROCHIP TECH INC
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Also, test pattern logic and interfacing / multiplexing circuits become more complex, especially when the pin count (external connections) of the IC package is small in number

Method used

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  • Instrument amplifier calibration method, system and device
  • Instrument amplifier calibration method, system and device
  • Instrument amplifier calibration method, system and device

Examples

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Embodiment Construction

[0025] Referring now to the drawings, details of example embodiments are schematically illustrated. Like elements in the drawings will be represented by the same numerals, and similar elements will be represented by the same numerals with different lowercase letter suffixes.

[0026] refer to figure 1 , depicted is a schematic block diagram of the basic architecture of an instrumentation amplifier (INA). An instrumentation amplifier (INA) with indirect current feedback (INA) 102 includes a first transconductance stage 104 , a second transconductance stage 110 , a transimpedance amplifier 108 and a summing node 106 . The output current I from the first transconductance stage 104 is added in the summing node 106 1 , and subtract the output current I from the second transconductance stage 110 in the summing node 106 2 . The differential current output from summing node 106 is applied to transimpedance amplifier 108 which converts this current input to a voltage output. The ...

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Abstract

The present invention discloses the calibration of the gain and / or offset of an instrumentation amplifier INA by coupling an appropriate number of current sources and / or current sinks to the first and / or second transconductance, respectively, of the INA. level to complete. Gain and / or offset calibration of the INA may occur upon user request and / or upon occurrence of an event. In determining which of the current sources and sinks are coupled to the first and / or second transconductance stages of the INA for gain and / or offset calibration of the INA A / D converters use voltage references in combination. After the gain and / or offset calibration of the INA is completed, the selection of the constant current sources and current sinks used thereby may be stored in volatile or non-volatile memory. Parity checking of the memory can be incorporated, and if a parity error is detected, automatic calibration of the INA can be initiated.

Description

[0001] Related Patent Applications [0002] This application claims Serial No. 61 / 298,371, filed January 26, 2010, by James B. Nolan and Kumen Blake, entitled "Instrumentation Amplifier Calibration Method , System and Apparatus)" and Serial No. 12 / 559,579 filed September 15, 2009 by James B. Nolan and Kumen Blake is the priority of the U.S. Patent Application for "Self Auto-Calibration of Analog Circuits in Mixed Signal Integrated Circuit Devices"; both of which are incorporated herein by reference for all purposes. technical field [0003] The present invention relates to integrated circuit instrumentation amplifiers, and more particularly, to calibration of integrated circuit instrumentation amplifiers. Background technique [0004] Integrated circuits are becoming more complex, yet their prices are falling. The combination of both analog and digital functions fabricated on an integrated circuit die or packaged in a multi-chip package (MCP) is becoming more common and f...

Claims

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Application Information

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Patent Type & AuthorityPatents(China)
IPC IPC(8): H03F1/30H03F3/45
CPCH03F1/30H03F3/45197H03F3/45
Inventor詹姆斯·B·诺兰库门·布莱克
OwnerMICROCHIP TECH INC