Fault injection method and device of transistor-transistor logic

A technology of transistor logic and fault injection, which is applied in the direction of logic circuit coupling/interface, logic circuit connection/interface layout, etc. using field effect transistors. It can solve the problems of different logic voltage thresholds and inability to connect directly, and achieve flexible operation.

Active Publication Date: 2015-03-11
BEIJING WATERTEK INFORMATION TECH
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The TTL interface has a series of level standards, including 5V TTL, 3.3V LVTTL and 2.5V LVTTL, etc. The logic voltage thresholds of each level standard are different, so they cannot be directly connected

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Fault injection method and device of transistor-transistor logic
  • Fault injection method and device of transistor-transistor logic
  • Fault injection method and device of transistor-transistor logic

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0039] The applicant of the present invention considers that the voltage threshold level of each actual TTL / LVTTL interface can be detected by adjusting the voltage amplitude of the signal, so as to realize the interconnection between TTL / LVTTL signals of different voltages. Therefore, a TTL fault injection method is provided. Especially in this embodiment, the applicant of the present invention also changed the traditional thinking of those skilled in the art, and proposed for the first time that TTL signals are processed as analog signals. In this way, compared with simple digital signals, processing of analog signals can increase a variety of fault injection situations, making fault injection operations more flexible and repeatable. The specific fault injection process in this embodiment is as follows: figure 1 As shown, including the following steps:

[0040] Step 100, sampling the TTL signal of the output port according to the analog signal to obtain a digital signal, that i...

Embodiment 2

[0054] This embodiment proposes another fault injection method based on the idea of ​​the above-mentioned embodiment 1. When the method obtains a TTL signal at the output port, the digital signal is obtained, but when the fault signal is injected into the input port, the analog signal is selected. Signal, the processed analog signal is injected into the input port as a TTL signal. Specifically, the process of implementing fault injection in this embodiment is as follows:

[0055] Step A: Collect the TTL signal of the output port, where the TTL signal is a digital signal;

[0056] Among them, this step can collect the TTL signal of the output port according to the prior art. For example, when the output port voltage is less than 0.8V, the collected TTL signal is 0, and when the output port voltage is above 0.8V, the collected TTL signal is 1. In some cases, you can reset the definition of TTL signal according to different application scenarios. For example, when the output port vo...

Embodiment 3

[0064] This embodiment introduces a fault injection device, which can implement the fault injection method of Embodiment 1 above. The device is like figure 2 As shown, it includes a data acquisition unit and a data processing unit. The data acquisition unit can collect the voltage signal of the output port and send the collected data to the data processing unit for processing. The data processing unit mainly adjusts the voltage amplitude of the output signal; and the data processed by the data processing unit is sent to the input port . In this way, the data at the input port is the signal after fault injection and level adjustment. The following describes the specific functions of each part.

[0065] The data acquisition unit samples the TTL signal (ie TTL signal 1) of the "output port" according to the analog signal to obtain a digital signal, and sends the digital signal to the data processing unit;

[0066] Among them, the data acquisition unit can use ADC to sample the TTL...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a fault injection method and a device of TTL (transistor-transistor logic), belonging to the field of TTL interface standard, signal acquisition and process. The fault injection method of the TTL disclosed by the invention includes the steps of: performing module sampling on a TTL signal at an output port according to an analog signal so as to obtain a digital signal, converting the digital signal to an input voltage, after comparing the input voltage with the set high low-level voltage threshold values, obtaining a logic level, converting the logic level to an output level, and sending the output level as the TTL signal to the output port. Due to adoption of the embodiment, so that fault injection of TTL can be achieved, and in addition, in the scheme provided by the embodiment of the invention, the device is flexible to operate, the fault injection can be achieved repeatedly and operated quantitatively.

Description

Technical field [0001] The invention relates to the field of Transistor Transistor Logic (TTL) interface standards, signal acquisition and processing, and in particular to a TTL fault injection method and device. Background technique [0002] TTL interface is the most commonly used level standard, which is widely used in data communication connections of various electronic products. TTL interface has a series of level standards, including 5V TTL, 3.3V LVTTL and 2.5V LVTTL, etc. The logic voltage threshold of each level standard is different, so it cannot be directly connected. Summary of the invention [0003] The technical problem to be solved by the present invention is how to realize TTL fault injection, so a TTL fault injection method and device are provided. [0004] In order to solve the above problems, the present invention discloses a TTL fault injection method, including: [0005] The TTL signal of the output port is sampled in analog to digital according to the analog sign...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): H03K19/0185
Inventor 付景志彭时涛万波
Owner BEIJING WATERTEK INFORMATION TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products