A kind of igbt with terminal deep level impurity layer

A deep-level impurity and terminal technology, which is applied in the direction of electrical components, circuits, semiconductor devices, etc., can solve the problems of device avalanche breakdown, large conduction loss, and small conduction voltage drop, so as to improve the turn-off characteristics of the device, Effect of reducing high-temperature leakage current and improving shutdown characteristics

Inactive Publication Date: 2014-10-15
UNIV OF ELECTRONICS SCI & TECH OF CHINA +1
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The biggest advantage of IGBT is that it can withstand the current impact no matter in the conduction state or in the short circuit state. The disadvantage is that the internal resistance of the high-voltage IGBT is large, resulting in large conduction loss. Multiple in series, and low tolerance for overvoltage, overheating, impact resistance, anti-interference, etc.
[0003] When the IGBT is forward-conducting, the positive gate voltage makes the channel open, and the emitter electrons flow through the channel to the drift region. Due to the forward bias of the collector, a large number of holes in the collector region flood into the drift region, and the drift region A large number of electrons have a conductance modulation effect, which can make the turn-on voltage drop of the IGBT much smaller than that of the VDMOS; when the IGBT is turned off, the gate voltage is negative voltage or zero voltage, the emitter electrons suddenly disappear, and the collector is high Voltage, a large number of holes continue to flow to the drift region, forming a large hole current, at this time the IGBT is in the reverse blocking state, due to the parasitic PNP tube α PNP As the temperature increases sharply, the leakage current of the IGBT increases significantly with the increase of temperature. High temperature and large leakage current can easily cause avalanche breakdown or even burn out of the device.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A kind of igbt with terminal deep level impurity layer
  • A kind of igbt with terminal deep level impurity layer
  • A kind of igbt with terminal deep level impurity layer

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] Specific implementation plan

[0021] An IGBT with a terminal deep-level impurity layer, and its cell structure is as figure 2 As shown, it includes a metal active emitter 1, a polysilicon gate electrode 2, a metal collector 3, a gate oxide layer 4, an N+ active region 5, a P-type base region 6, a P-type equipotential ring 7, a polysilicon field plate 8, Metal aluminum field plate 9, terminal region oxide layer 10, terminal polysilicon field plate 11, P-type field limiting ring 12, N+ electric field stop ring 13, N- drift region 14, N+ electric field termination layer 15, P+ collector region 16;

[0022] The device from the bottom layer to the top is the metal collector 3, the P+ collector region 16, the N+ electric field stop layer 15, and the N- drift region 14. The P-type base region 6 is located on the top of the N- drift region 14, and the P-type base region 6 has N+ active area 5, the cell surface is in contact with the N+ active area 5 and the P-type base area 6 resp...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to an IGBT with a terminal deep-level impurity layer, which belongs to the technical field of semiconductor power devices. Based on the traditional Planar FS-IGBT, the invention injects a deep energy level impurity layer (15) into the terminal drift region (14). In the deep-level impurity layer (15), as the temperature of the device increases, the ionization degree of the deep-level impurities increases, and the impurity concentration increases significantly. When the IGBT is turned off, the increased carrier concentration in the terminal drift region is effectively reduced. The hole emission efficiency of the P+ collector region in the small terminal region reduces the parasitic PNP transistor αPNP, thereby effectively reducing the high-temperature leakage current of the device; the increased electron concentration in the drift region and the accelerated recombination of holes injected into the P+ collector region, and deep energy The level impurity itself is a recombination center, further accelerating the recombination of electrons and holes, effectively improving the turn-off characteristics and improving the reliability of the IGBT.

Description

Technical field [0001] The invention belongs to the technical field of semiconductor power devices, and relates to an insulated gate bipolar transistor (IGBT). Background technique [0002] IGBT not only has the advantages of MOSFET's high input impedance, low control power, simple drive circuit, and high switching speed, but also has the advantages of high current density of bipolar power transistors, reduced saturation voltage, and strong current handling capabilities. Therefore, the three major characteristics of IGBT power devices are high voltage, high current, and high speed, which are unmatched by other power devices. Therefore, it is a very ideal switching device in the field of power electronics. IGBT products combine the three major technical advantages of high frequency, high voltage and high current. At the same time, IGBT can realize energy saving and emission reduction, and has good environmental protection benefits. IGBT is widely used in the power field , Consume...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): H01L29/36H01L29/739
Inventor 李泽宏李巍夏小军赵起越张金平任敏张波
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products