Automatic test equipment (ATE) test result judging method and ATE test method

Abstract

The invention provides an automatic test equipment (ATE) test result judging method and an ATE test method. The ATE test result judging method based on output state of reading signals includes step1 starting a test; step2 executing specific signal expectation output modification; step3 executing comparison of waveform of test output signals and expected waveform; step4 recording invalid beat of specific signals; step5 processing recorded invalid test data, step6, acquiring expected code stream of the specific signals; step7, comparing the code stream information of the specific signals with the expected code stream; and step 8 comparing output waveform of other output signals with the expected waveform. The ATE test result judging method further includes step9 outputting comparison results of the code stream and the expected code stream and comparison results of other signal output waveform and the expected waveform according to the specific signals to obtain detailed test classification information output.

Description

technical field [0001] The present invention relates to the field of integrated circuit testing, and more specifically, the present invention relates to a method for judging ATE test results based on reading signal output states. In addition, the present invention also relates to an ATE test method. Background technique [0002] With the increasing complexity of integrated circuits, high requirements are put forward for the judgment of the output results on ATE (automatic test equipment, automatic test equipment). A new type of ATE test results based on the output state of the read signal is proposed. The judgment method realizes the function of judging some complex and special output states of integrated circuits, and solves the problem that many circuit functions cannot be tested and classified on ATE. [0003] Traditionally, the ATE test results are compared with the output of the device under test and the expected output by the comparator in the channel of the ATE test e...

AI Technical Summary

Problems solved by technology

[0004] However, with the development of integrated circuits, the output of the circuit is becoming more and more complex, resulting in the current ATE comparison test method can not meet its test requirements

Take the following two situations as examples. One is that multiple clock domains and various protocols are integrated inside the integrated circuit. During functional testing, the signal cannot output a fixed state at a fixed time and a fixed beat.

The second is that there are more and more integrated internal modules. If these modules adopt the serial test method, the test time will be longer, which will reduce the test efficiency. However, if the parallel test method is used, the test results can only be directly compared to PASS or FAIL. It is not possible to classify according to the test results of each module

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