Method for testing microwave dielectric property of high-loss dielectric substance
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- ZHEJIANG UNIV
- Publication Date
- 2012-11-28
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Abstract
Description
technical field
[0001] The invention belongs to the technical field of microwave testing, in particular to the testing technology of microwave dielectric properties of high-loss dielectric materials. Background technique
[0002] High loss (greater than 10 -2 ) Dielectric materials such as ferroelectric materials and giant permittivity materials have important potential application prospects in the microwave frequency band, but their microwave dielectric properties are difficult to accurately test. The test methods for microwave dielectric properties of high loss materials mainly include reflection method, reflection-transmission method and resonant cavity perturbation method. For the former two, the scattering parameters at a single frequency point are directly used to calculate the dielectric properties, and as the dielectric constant increases, the scattering parameters are less and less sensitive to the change of the dielectric constant, so the test The accuracy also d...