A high-precision test method for microwave dielectric properties of high-loss materials

A microwave dielectric and testing method technology, applied in the direction of dielectric property measurement, measuring device, measuring electric variable, etc., can solve problems such as uneven distribution of electric field, measurement error, and influence on electromagnetic field distribution of resonant cavity, so as to achieve accurate testing and improve The effect of test accuracy

Active Publication Date: 2021-05-28
XI AN JIAOTONG UNIV
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Problems solved by technology

The problem with this structure is that it is impossible to ensure that the ceramic reference sample and the sample to be tested are in the geometric center of the cavity during the actual measurement process. The resulting problem is that the structure only has symmetry in the vertical direction, but in the direction of the feeding axis. It does not have complete symmetry, so the electric field distribution at the interface between two different electrical performance materials will be uneven, which will affect the electromagnetic field distribution in the resonant cavity, bring errors to the measurement of resonant frequency and quality factor, and cannot realize high-loss dielectric material microwave Accurate measurement of dielectric properties

Method used

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  • A high-precision test method for microwave dielectric properties of high-loss materials
  • A high-precision test method for microwave dielectric properties of high-loss materials
  • A high-precision test method for microwave dielectric properties of high-loss materials

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Experimental program
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Effect test

Embodiment 1

[0052]A microwave dielectric property test is performed on paraffin wax, molten stone glass and purity of 99.6% of stabilized dielectric properties.

[0053]Circular medium resonator is a ceramic of 10 mm, an inner diameter of 3 mm, and its dielectric constant is 36.7, and the loss is 1 × 10-4The sample to be tested is paraffin, molten stone glass and alumina in diameter of 3 mm, height 5mm, respectively.

[0054]The test results are shown in Table 1.

[0055]Table 1

[0056]

[0057]The test results are very close to the test results with the simulation results with the methods provided by the present invention, and the test results are very close to the test results, which proves that the method is feasible and the test accuracy is high.

Embodiment 2

[0059]Microwave dielectric properties of absorbing materials with high dielectric losses are performed.

[0060]Circular medium resonator is a ceramic of 10 mm, an inner diameter of 3 mm, and its dielectric constant is 36.7, and the loss is 1 × 10-4The sample to be tested is 3 mm in diameter and a height of 5 mm. It is made of 1%, 2%, 4%, 8%, and 16% uniform mixing according to the mass ratio of paraffin and toner, respectively.

[0061]The test results are shown in Table 2.

[0062]Table 2

[0063]

[0064]It is known from Table 2 that the coaxial air line is affected by the sample, the environmental factor has a large effect, low testing accuracy, and the microwave dielectric properties under temperature change conditions cannot be achieved. The method provided by the present invention has higher test accuracy compared to the coaxial air line method, which is more relaxed to the sample production, and provides precise testing of microwave dielectric properties of the absorbing material under tem...

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Abstract

The invention discloses a method for measuring the microwave dielectric properties of high-loss materials by adopting an electric field symmetry structure. On the basis of the traditional resonance method, a perturbation method with an electric field symmetry structure is adopted, which mainly consists of the following structures: TE 011 Mode metal resonant cavity, high-Q circular TE 011 A mode dielectric resonator, a coupling adjustment device and a circular rod-shaped sample to be tested. by TE 011 Mode ring resonators and metal resonators can limit the test frequency to a specific frequency range. During the test, put the round rod-shaped sample to be tested into the circular TE 011 In the mode dielectric resonator, the measured sample can be better positioned at the axial center of the metal resonant cavity, reducing the error caused by the position offset, ensuring that the electric field structure is a symmetrical structure, and improving the interface between two materials with different electrical properties The uniformity of electric field distribution can effectively improve the test accuracy of dielectric properties.

Description

Technical field[0001]The present invention belongs to the technical field of microwave dielectric performance, including, but not limited to, high dielectric loss materials and testing of microwave dielectric properties under temperature change conditions.Background technique[0002]With the development of microwave technology, the use of high-grade electricity loss materials represented by the absorbing material is increasingly widely used in the field of aerospace, electromagnetic pollution, and the precise dielectric performance is required in many practical applications, but The precise test of high dielectric losses in microwave band dielectric performance has always been a problem.[0003]The test method of the microwave dielectric performance of the high dielectric loss material is mainly based on transmission / reflection method, and the representative method has free space method, waveguide method, coaxial air line method, etc., these methods are tested during the test. Sensiti...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R27/26
CPCG01R27/2617G01R27/2658
Inventor 向锋熊刚李建壮张波郭永钊董亦鹏
Owner XI AN JIAOTONG UNIV
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