Optical device for focusing synchrotron radiation light source

An optical device and light source technology, applied in the field of materials and optics, can solve problems such as affecting the normal measurement of absorption spectra, erroneous experimental conclusions, affecting the calibration accuracy of light sources, detectors and optical components, etc.

Inactive Publication Date: 2013-01-23
BEIJING NORMAL UNIVERSITY
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Problems solved by technology

Because diamond has a crystalline structure, the diffraction signal generated by diamond seriously affects the normal measurement of absorption spectrum when performing high-pressure absorption spectrum measurement
[0005] In addition, the monochromatic light emitted by continuous spectrum synchrotron radiation after passing through the monochromator contains high-order harmonics, and high-order harmonics seriously affect the calibration accuracy of light sources, detectors and optical components, and the experimental data will be affected by harmonic interference. And increase the error, and even lead to wrong experimental conclusions

Method used

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  • Optical device for focusing synchrotron radiation light source
  • Optical device for focusing synchrotron radiation light source
  • Optical device for focusing synchrotron radiation light source

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Embodiment Construction

[0024] The preferred embodiments of the present invention will be described below in conjunction with the accompanying drawings. It should be understood that the preferred embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention.

[0025] The inventors of the present application have found that the current optical device composed of glass capillary tubes has a Gaussian distribution of light intensity after converging X-rays, that is, the light intensity in the central area is significantly higher than that in the edge area. However, in practical application and research, it is more desirable to obtain X-rays with more uniform light intensity. Therefore, in this embodiment, a solid capillary is used in the central area and a hollow capillary is used in the peripheral area, that is, an optical device for focusing the synchrotron radiation source, so that the converged X-rays are more uniform. It...

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Abstract

The invention discloses an optical device for focusing a synchrotron radiation light source. The optical device is used for improving light intensity uniformity degree of emergent lights, increasing emittance of emergent light beams and inhibiting higher harmonics of synchrotron radiation. An outside bus of the optical device is a quadratic curve segment or a combination of a plurality of quadratic curve segments, wherein openings of the plurality of quadratic curve segments face to the same direction. The optical device comprises a plurality of capillary bodies made of transparent materials, wherein the capillary bodies arranged in the central area are of solid structures; and the capillary bodies arranged in the peripheral area outside the central area are of hollow structures.

Description

technical field [0001] The invention relates to the technical field of materials and optics, in particular to an optical device for focusing a synchrotron radiation light source. Background technique [0002] Due to its unique properties such as high brightness, collimation, and continuously adjustable energy, synchrotron radiation sources have become an important tool for revealing material structures and life phenomena, and are widely used in materials, geology, biology, environment, and archaeology. With the development of synchrotron radiation technology, X-ray microbeam analysis technology using X-ray focusing optical elements has become the mainstream analysis technology for synchrotron radiation applications. [0003] Synchrotron radiation facilities are distinguished from construction, performance and use, and have experienced three generations of development. The characteristics of the first-generation and second-generation synchrotron radiation facilities: the sou...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G21K1/06
Inventor 李玉德林晓燕何金龙刘志国
Owner BEIJING NORMAL UNIVERSITY
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