Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for seamlessly splicing 3*3 plane array detector by adopting total reflection prisms

A technology of area array detectors and total inverse prisms, applied in the direction of instruments, electric solid-state devices, semiconductor devices, etc., can solve the problems of inability to realize light energy, loss of light energy, and many times of light splitting, and achieve stable and reliable splicing without field of view Effect of missing, no kinematic mechanism

Inactive Publication Date: 2015-02-18
INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Chen Xunan et al. In the focal plane optical splicing technology of multi-slice area CCD image sensor, the single-lens optical splicing method can realize the splicing of multi-slice area CCD, but the number of light splitting is too many, the loss of light energy is serious, and the working distance behind the optical system is required to be large. However, it cannot be realized in the large field of view surveying and mapping camera system or there is a serious shortage of light energy
[0005] Chinese invention patent CN 101650423B’s optical splicing of large area array photoelectric devices can only realize the splicing of area array detectors in 2×3 or 2×2 mode, and cannot realize the splicing of more area array detectors or larger-scale area array detectors

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for seamlessly splicing 3*3 plane array detector by adopting total reflection prisms
  • Method for seamlessly splicing 3*3 plane array detector by adopting total reflection prisms

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0029] Such as figure 1 As shown, the present invention includes 6 pieces of reflective prisms and 9 pieces of area array detectors, such as 10k×10k area array detectors.

[0030] Such as figure 2 As shown, the numbering of the combined image plane array is from top to bottom and from left to right, that is, the top row is the first row, the bottom row is the third row; the leftmost column is the first column, and the rightmost column is the third row List. The first line is area array detectors 1~3, the second line is area array detectors 4~6, and the third line is area array detectors 7~9; the combined image plane is divided into 9 area array detectors according to the corresponding combination Areas 1 to 9 of the image surface.

[0031] Establish a space Cartesian coordinate system, the origin O is located in the upper left corner of the image plane; the X-axis is the direction of increasing columns, that is, from left to right; the Y-axis is the direction of increasing...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a method for seamlessly splicing 3*3 plane array detectors by adopting total reflection prisms, which realizes the seamless splicing of image planes formed by combining 3*3 mode nine plane array detectors. The total reflection prisms are combined to realize the image plane light splitting, three plane array detectors are arranged on an optical-axis vertical transmission image plane, and six plane array detectors are arranged on four side planes. The prisms are simple in structure, and no energy is lost after total-reflection total-transmission light splitting. The splicing of image planes is realized by combining small-scale plane array detectors, thus the demand of the large-scale or super-large scale plane array detectors can be met. The method can be applied to the aerospace optical imaging and optical detection instrument and equipment, in particular to the aerospace imaging photoelectric system suitable for the super-large scale plane array detectors.

Description

technical field [0001] The invention belongs to an imaging photoelectric system for seamless splicing of ultra-large area array detectors, in particular to a method for seamless splicing of 3×3 area array detectors by using a total reflection prism. Background technique [0002] With the development of aviation and aerospace technology, the demand for photoelectric imaging systems with large area arrays and ultra-large area arrays is becoming more and more urgent. Two methods are often used to realize large-scale area array imaging. One is to customize ultra-large-scale area array detector devices at the area array detector manufacturer, and the other is to use area array detectors to splice. At present, the scale of single-chip large area array detectors in the world is about 17k×15k (DMC250), which is not a commodity on the shelf, and the application cost is expensive. In addition, further increasing the scale of single-chip area array detectors is also a technical bottle...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H04N5/225G02B17/04H01L25/065
Inventor 梁伟高晓东
Owner INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products