Particle combination method in secondary electron multiplication simulation of microwave part

Abstract

The invention relates to a particle combination method in secondary electron multiplication simulation of a microwave part. The method includes first building a three-dimensional geometrical model of the microwave part and building a particle simulation domain to conduct secondary electron multiplication effect value simulation, then setting a particle combination threshold, conducting particle combination when the total particle number of the particle simulation area is larger than the particle combination threshold, classifying the particles according to speed phase space, dividing every four particles into a set according to energy, combining the four particles in each set into two particles, compensating the surplus particles to achieve combination of all the particles in the particle simulation area. The particle combination method ensures that particle energy conservation is consistent with phase space distribution around the combination, can be applied for a plurality of times in secondary electron multiplication simulation of the microwave part, increases calculation efficiency by times and is especially suitable for greatly improving micro discharge and low air pressure discharge value analysis efficiency under certain hardware conditions.

Description

technical field [0001] The invention relates to the application field of special space effects, in particular to a particle merging method in secondary electron multiplication simulation of microwave components. Background technique [0002] In a vacuum or low pressure working environment, electrons are accelerated under the action of electromagnetic fields of microwave components. The transit time is equal to an odd multiple of the radio frequency period of the electromagnetic field, and the number of electrons grows in an avalanche, resulting in a secondary electron multiplication effect, which deteriorates the signal of the microwave components, and even causes permanent damage to the components. [0003] In order to overcome the limitation of the numerical simulation accuracy and the numerical simulation of the complete physical process of secondary electron multiplication due to the sharp increase in the amount of calculation caused by the avalanche growth of the number...

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Problems solved by technology

[0006] Later, Grasso and Frignani et al. proposed a particle merging method named hierarchical aggregation, which can accurately guarantee the grid node c

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