Defect inspection device for solar cells and inspection method
A solar cell and defect detection technology, applied in the monitoring of photovoltaic systems, optical testing defects/defects, photovoltaic power generation, etc., can solve problems such as image discrimination of difficult polycrystalline solar cells
Inactive Publication Date: 2013-04-10
NPC CO LTD
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However, this is not documented at all in Comparative Document 1
[0012] In addition, in the EL method, there is a problem that, in the case of inspecting a polycrystalline solar cell, when a forward current flows, it is affected by the grain boundary portion of power generation existing in the polycrystalline solar cell and does not generate electricity. Influenced by the grain boundary part of the polycrystalline solar cell, it is difficult to discriminate from the image between the grain boundary pattern of the polycrystalline solar cell and the defect
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[0067] Hereinafter, embodiments of the present invention will be described with reference to the drawings.
[0068] figure 1 An overall configuration of a solar cell defect inspection device according to an embodiment of the present invention is shown.
[0069] This defect detection device includes a mounting table 1, a detection probe 2, a main light source 3, a sub light source 4, a light source control circuit 5, a moving device 6, a shunt resistor 7, an amplifier 8, a bias current extraction circuit 9, and a bias current cancellation circuit. 10. Mute circuit 11 , analog-to-digital (hereinafter referred to as “A / D”) converter 12 , image processing device 13 and display 14 .
[0070] The mounting table 1 is mounted with the solar cell S, and the mounting table 1 is provided on the upper part of the defect detection apparatus, and here the solar cell S which is a measuring object is mounted with the light-receiving surface facing downward. It is worth noting that the solar...
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This invention provides an inspection device for solar cells and an inspection method, which can, considering a flowing bias current and bypass of a resistance component of a subject unit under inspection, inspect a defect with high precision. The device comprises: a major light source(3) for irradiating light to the subject unit under inspection, a minor light source(4) for irradiating light to other units, a shunt resistor(7) for converting an output current of the solar cells into a voltage, an amplifier(8) for amplifying the voltage, a bias current extraction circuit for extracting a bias current contained in the output, a bias current offset circuit(10) for deducting the bias current from the output of the amplifier, an A / D converter (12)for digital data conversion, a graphic processing device (13)for graphic processing, and a display for graphic display(14). In addition, the inspection is carried out according to the considered bias current and a starting current component of the generated power of the subject unit under inspection.
Description
technical field [0001] The invention relates to a device and method for detecting solar cell defects. Background technique [0002] In recent years, with the improvement of environmental awareness, more and more solar cells have been distributed in the market. In this process, it is particularly important to detect the performance of the solar cell itself and to identify and remove defective solar cells in the manufacturing process. [0003] Patent Document 1 described below discloses a solar cell output measurement device using two light sources, a main light source unit and a sub light source unit. In a solar cell, in the case where a plurality of solar cells are connected in series, the output current value of the entire device becomes the same as that generated by the solar cell with the least amount of power generation. Therefore, the main light source part irradiates light to the light-receiving surface of some measurement target cells of the solar cell, and the sub-...
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IPC IPC(8): G01N21/88
CPCY02E10/50Y02P70/50H02S50/10H02S50/15
Inventor 吉野征治
Owner NPC CO LTD