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Array substrate, display device and detection method

A technology of array substrates and detection methods, applied in static indicators, nonlinear optics, instruments, etc., can solve problems such as the complexity of the array substrate testing process, achieve the effects of improving test efficiency, simplifying the test process, and saving test time

Active Publication Date: 2016-01-13
BEIJING BOE OPTOELECTRONCIS TECH CO LTD
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  • Application Information

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Problems solved by technology

Therefore, the test point needs to be changed during the test, which makes the test process of the entire array substrate very complicated

Method used

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  • Array substrate, display device and detection method
  • Array substrate, display device and detection method
  • Array substrate, display device and detection method

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specific Embodiment approach

[0046] As a specific implementation manner of the present invention, the detection object of the detection method is the data line and / or the gate line in the array substrate. by figure 1 The array substrate shown is taken as an example. When testing the data lines of the array substrate, it is assumed that there are 4 data lines (defined as one data line, two data lines, and three data lines from left to right) on the array substrate. , four data lines), the first end of the data line 1 is connected to the drive unit 4 . A drive signal is input into data line 1. For example: the driving unit includes a data driving unit and a gate driving unit, and the data driving unit is used to input driving signals to the data lines. The driving signal may include, for example, an AC voltage signal, a sawtooth wave voltage signal, or other common driving voltage signals and the like.

[0047] Step b, closing the first switch at the head end of the data line and / or gate line to be teste...

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Abstract

The invention discloses an array substrate, a display device of the array substrate and a detection method of the array substrate, and relates to the field of liquid crystal display. The array substrate, the display device of the array substrate and the detection method of the array substrate are capable of accomplishing detection work to each grid line / data line in the array substrate under the condition that no test point is changed, and therefore simplify a test process of the entire array substrate. The array substrate comprises a plurality of grid lines, a plurality of data lines and pixel units defined by the grid lines and the data lines in a cross mode. A first switch is arranged at the head end of at least one data line and / or one grid line. A second switch is arranged at the tail end of the data line and / or the grid line which is provided with the first switch. The first switch is connected on a first test point which is used for testing data of the head end of the data line and / or the grid line. The second switch is connected on a second test point which is used for testing data of the tail end of the data line and / or grid line.

Description

technical field [0001] The present invention relates to a display field, in particular to an array substrate, a display device and a detection method. Background technique [0002] As an important part of the display panel, the array substrate is produced through a patterning process. When patterning the array substrate, a plurality of data lines, a plurality of gate lines, and a TFT (ThinFilmTransistor, thin film transistor) pixel unit defined at the intersection of the data line and the gate line are respectively formed on the substrate. The pixel unit includes: a thin film transistor device, a common electrode wait. [0003] After the patterning is completed, in order to grasp the relevant performance of the array substrate, such as: data line / gate line driving capability, data driving / scanning driving IC (Integrated Circuit, integrated circuit, integrated circuit, integrated circuit, data delay time between the first end / end and other parameters, etc., it is also necess...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02F1/1362G02F1/1368G02F1/13G09G3/36
Inventor 邓立广刘英明段亚锋李建
Owner BEIJING BOE OPTOELECTRONCIS TECH CO LTD
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