Comprehensive test instrument for testing multi-path conducting wire\connector

Abstract

The invention discloses a comprehensive test instrument for testing multi-path conducting wires\connectors. The comprehensive test instrument is provided with a test instrument body, wherein the test instrument body consists of a mounting base plate, an operating panel and a housing; a printed circuit board is arranged on the mounting base plate; a singlechip main board and a data acquisition module are respectively mounted on the printed circuit board of the mounting base plate; the singlechip main board is respectively connected with the data acquisition module and a touch screen display module mounted on the operating panel through an RS232 / RS485 communication interface; the data acquisition module is connected with a main interface board arranged on the operating panel and an SATA (serial advanced technology attachment) interface board through conducting wires; and a conducting wire\connector pushing plate arranged at the front end of the main interface board is connected with a push-off air cylinder mounted behind the operating panel through a travel compensation column. The comprehensive test instrument for testing multi-path conducting wires\connectors is used for carrying out comprehensive tests such as on-off state, voltage readings and signal categories on the multi-path conducting wire\connectors inserted into the main interface board and the SATA interface board by adopting the scan-round mode through the data acquisition module connected with the singlechip main board via the RS485 communication interface, and further, whether a product is qualified or not is judged according to set range parameters.

Description

technical field [0001] The invention belongs to the technical field of electronic testing equipment, and relates to a testing instrument, in particular to a comprehensive tester for testing multi-channel wires / connectors. Background technique [0002] The wires / connectors used for the input, output, connection, and transfer of electronic products are of various types and shapes, and it is impossible to guarantee that all wires are in good contact. Should each wire on each connector be in The corresponding position, and whether the shape of each connector meets the requirements of the organization. [0003] In view of this, it is necessary to test the on-off condition, voltage reading value, and signal type of each connector, each wire before leaving the factory, because the existing testing instruments have the following defects: [0004] 1. Low measurement accuracy (≤0.01V), slow test speed (≥6 seconds / time); [0005] 2. The equipment has a single function and can only te...

AI Technical Summary

Problems solved by technology

[0004] 1. Low measurement accuracy (≤0.01V), slow test speed (≥6 seconds / time);

[0005] 2. The equipment has a single function and can only test whether the wire is on or off. It is necessary to adjust the on-off status of the mechanical switch to choose whether to test each connector and each wire, which brings great inconvenience to debugging and setting;

[0006] 3. The setting of the test instrument is cumbersome, the workload of the debugger is heavy, and there is no comparison function, which will lead to misjudgment due to incorrect settings;

[0007] 4. It does not have the functions of storage, statistics, output, and printing of test data, and cannot display specific test information, error items and fault locations, and cannot retrospectively query the historical information of test data;

[0008] 5. The test instrument does not have a network or other interfaces, and cannot use the network for remote control and collection of test data;

[0009] 6. The wire / connector needs to be plugged and unplugged manually during the test, the workload is heavy, and it is easy to cause equipment failure due to misoperation, and the maintenance of the instrument is more complicated.

So far, no manufacturer has been able to provide a comprehensive tester for testing multiple wires\connectors at the same time, so it has brought great difficulties to the comprehensive testing of such wires\connector products

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