Circuit used for preventing lamp light source aging

A circuit and light source technology, applied in the field of lamp quality testing, can solve problems such as long aging time, reduced work efficiency, and inaccurate aging time

Inactive Publication Date: 2013-06-19
OCEANS KING LIGHTING SCI&TECH CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] Generally, the aging time is relatively long, and if the experimenter has been waiting by the test circuit, the work efficiency will be greatly reduced; but if there is no experimenter to monitor the test circuit at any time, it is impossible to know how long the aging has lasted during a power outage, thus The aging time is inaccurate, which affects the results of the quality test of the lamps

Method used

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  • Circuit used for preventing lamp light source aging

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Embodiment Construction

[0016] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0017] Embodiments of the present invention will be described below with reference to the accompanying drawings. see figure 1 , is a circuit structure schematic diagram of an embodiment of an aging circuit for a lamp light source in the present invention. The circuit includes an accumulative timer 100 (type ELR-4A-H), a DC power supply module 200, and a relay K1. The common terminal 7 of the accumulative timer 100 is connected to the power output terminal of the D...

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Abstract

The invention discloses a circuit used for preventing lamp light source aging. The circuit used for preventing lamp light source aging comprises a direct current power supply module, an accumulated counter and a relay K1. A public end of the accumulated counter is connected with a power supply output end of the direct current power supply module. One end of a coil of the relay K1 is connected with a normal close end of the accumulated counter. The other end of the coil of the relay K1 is connected with the ground. One of touch spots of the relay K1 is electrically connected with one end of a to-be-aged lamp light source. The other of the touch spots is connected with a zero line of an electric supply. The other end of the to-be-aged lamp light source is connected with a firing line of the electric supply. The public end and the normal close end of the accumulated counter are connected. A first working power supply input end and a second working power input end of the accumulated counter are respectively connected with the zero line of the electric supply and the firing line of the electric supply. Due to the fact that the accumulated counter is adopted to record testing time of lamp aging, the accumulated counter automatically store the last counting time in power failure and accumulates the counting time on the last counting value when being started next time, lamp aging time can be accurately controlled as a set value and artificial monitoring is not needed.

Description

technical field [0001] The invention relates to the field of lamp quality testing, in particular to a circuit for lamp light source aging. Background technique [0002] Before the manufactured lamps leave the factory, a number of indicators need to be tested to ensure that they are all qualified products. The reliability of the light source directly affects the use of the lamp. Therefore, it is necessary to test the reliability of the light source before leaving the factory. The method of testing the reliability of the light source is aging. After lighting the lamp for a period of time, test the light source to see if it meets the regulations. [0003] Generally, the aging time is relatively long, and if the experimenter has been waiting by the test circuit, the work efficiency will be greatly reduced; but if there is no experimenter to monitor the test circuit at any time, it is impossible to know how long the aging has lasted during a power outage, thus The aging time is...

Claims

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Application Information

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IPC IPC(8): G01R31/44
Inventor 周明杰赵永川
Owner OCEANS KING LIGHTING SCI&TECH CO LTD
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