A Test Method for Voltage Fluctuation at Key Points of Circuit
A technology of voltage fluctuation and test method, applied in the direction of measuring current/voltage, measuring device, measuring electrical variable, etc., can solve problems such as system instability and inability to detect
Active Publication Date: 2016-03-23
PHICOMM (SHANGHAI) CO LTD
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Problems solved by technology
[0002] The current common voltage test method is: use a multimeter and other test tools to test whether the error between the actual voltage and the ideal voltage of the key points in the circuit system is within 5% to determine whether the system is working normally, but this test method cannot meet the " When the error between the working voltage and the ideal voltage is within 5%, other problems of the system are detected, and it is easy to ignore the cause of system instability
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[0015] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments, but not as a limitation of the present invention.
[0016] Such as figure 1 Shown is a circuit for testing voltage fluctuations at key points of the circuit in an embodiment of the present invention, the circuit includes a conventional system circuit to be tested (including power supply voltage DC, multiple circuit modules A, B and C), constant Voltage source and resistance R, point A in the figure is the key point of the circuit to be detected, modules A, B and C represent each circuit module in the system circuit, and the constant voltage source, resistance R and key point A of the circuit are connected in series in sequence; The negative pole of the constant voltage source is connected in series with the resistor R.
[0017] The voltage of the constant voltage source is constant at V 0 , V 0 The value of is equal to the ideal voltage of the...
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The invention discloses a testing method of voltage fluctuation of a circuit key point, and belongs to the technical field of methods of testing the voltage fluctuation of the circuit key point. The testing method specifically comprises the following steps: a, selecting the circuit key point to be detected from a circuit; b, adding a constant voltage source on the circuit key point, wherein voltage of the constant voltage source serves as ideal voltage V0 of the circuit key point in a constant mode; c, adding a resistor R between the circuit key point and the constant voltage source; and d, detecting a system current which passes the circuit key point. The testing method of the voltage fluctuation of the circuit key point has the advantages that stability of the design of a whole circuit system can be estimated according to a statistic value, and situations of shortcomings of an individual system of a product and instability of the system due to difference of elements and manufacture process of each single product can be found.
Description
technical field [0001] The invention relates to the technical field of a method for measuring voltage fluctuations at key points of a circuit, in particular to a test method for voltage fluctuations at key points of a circuit. Background technique [0002] The current common voltage test method is: use a multimeter and other test tools to test whether the error between the actual voltage and the ideal voltage of the key points in the circuit system is within 5% to determine whether the system is working normally, but this test method cannot meet the " When the error between the working voltage and the ideal voltage is within 5%, other problems of the system are detected, and it is easy to ignore the cause of system instability. Contents of the invention [0003] According to the defects existing in the prior art, a technical solution of a test method for voltage fluctuation at key points of a circuit is now provided, specifically including: [0004] A test method for volt...
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IPC IPC(8): G01R19/00
Inventor 黄威
Owner PHICOMM (SHANGHAI) CO LTD