Stress meter

A technology of strain gauges and focusing components, which is applied in the field of X-ray measurement, and can solve problems such as inability to detect, X-ray light intensity, etc.

Inactive Publication Date: 2013-08-14
BEIJING NORMAL UNIVERSITY
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In this way, the X-ray light intensity irradiated on the test sample is weak, and part of the diffracted light that could have entered the detector will be blocked by the collimator, so that it cannot be detected

Method used

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Embodiment Construction

[0024] The preferred embodiments of the present invention will be described below in conjunction with the accompanying drawings. It should be understood that the preferred embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention.

[0025] In the embodiment of the present invention, a focusing component is placed between the X-ray tube and the tested sample, and the focusing component may specifically be an optical device composed of multiple glass capillaries. The optical path is changed by the focusing part, and the divergent light from the X-ray tube to the tested sample is changed to converged light, so that the irradiation area on the tested sample is smaller, and the micro area measurement is realized, and compared with the one introduced in the background technology The light intensity of the method is stronger, which is beneficial to the reception and measurement of the detector.

[002...

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Abstract

The invention discloses a stress meter which is used for implementing measurement on residual stress of a micro domain. The stress meter comprises an X-ray tube, a focusing part and a detector, wherein the X-ray tube is used for providing an X-ray light source; the focusing part is used for collecting X-rays sent by the X-ray tube 201 and enabling the X-rays to exit; the detector is used for receiving X-rays diffracted by a to-be-tested sample and carrying out measurement on the residual stress; the X-ray tube and the detector are positioned on the circle of an angular instrument; a distance from an inlet of the focusing part to the X-ray tube is a front focal distance of the focusing part; and a distance from an outlet of the focusing part to the to-be-tested sample is a back focal length of the focusing part.

Description

technical field [0001] The invention relates to the technical field of X-ray measurement, in particular to a strain gauge. Background technique [0002] Residual stress refers to the internal stress that exists inside an object and maintains its own balance without external force or external moment. On the one hand, residual stress may adversely affect the fatigue strength and dimensional stability of materials, and is one of the main reasons for material failure and service life; on the other hand, sometimes in order to improve the fatigue resistance of materials, it is necessary to deliberately introduce Residual Stress. Therefore, the study of residual stress and its influence on materials is an important research content in the field of materials science and mechanics research. [0003] The test methods of residual stress are divided into two categories according to whether there is damage to the tested sample: destructive method and non-destructive method. The destru...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01L1/25
Inventor 李玉德郭非刘志国孙天希林晓燕
Owner BEIJING NORMAL UNIVERSITY
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