Fault injection system and fault injection method facilitating device fault sensitivity test

Abstract

Provided is a fault injection system and fault injection method facilitating a device fault sensitivity test. The fault injection system comprises a control chip, a device to be tested and a reference device, the device to be tested and the reference device are identical FPGA chips and are both connected with the control chip, and the control chip comprises a to-be-tested device fault injection module, an operation stimulating module, a result comparing module and a fault information uploading module. The control chip injects faults into a chip to be tested through a mode of turning over a configuration code stream, the device to be tested and a reference chip are operated simultaneously, and then the operating results of the device to be tested and the reference chip are compared. If the results are identical, the fact that the device to be tested has no fault is proved, and is not sensitive to the faults. If the results are different, the fact that faults occur to the device to be tested is proved, and the device to be tested is a fault-sensitive position. The fault injection system and fault injection method can detect the fault sensitivity of a programmable logic device conveniently.

Description

technical field [0001] The invention relates to a fault injection system and method for facilitating device fault sensitivity testing, and belongs to the technical field of reliability testing of programmable logic devices. Background technique [0002] With the development of programmable logic device technology, programmable logic devices are used in more and more fields, including applications in extreme environments such as space applications. In space applications, the single event effect caused by space high-energy particles cannot be ignored. Due to the reproducible characteristics of programmable logic devices, the impact of single event effect is particularly prominent. [0003] The most commonly used method to verify the extent to which single event effects affect programmable logic devices is the radiation test method. This method can simulate the impact of single event effects on programmable logic devices on the ground, but the cost of radiation tests is high an...

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Problems solved by technology

[0003] The most commonly used method to verify the extent to which single event effects affect programmable logic devices is the radiation test method. This method can simulate the impact of single event effects on programmable logic devices on the ground, but the cost of radiation tests is high and the cycle is long.

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