Self-testing built-in framework and test method of touch IC (integrated circuit) analog front end

Abstract

The invention discloses a self-testing built-in framework and a test method of a sense amplifier, a filter, a multiplexer and an ADC (analog to digital converter) touch IC (integrated circuit) analog front end. The self-testing built-in framework comprises a multi-way switch S1, a multi-way switch S2, a switch S3, a switch S4, an on-chip capacitor C, a drive signal generator, a multi-way sense amplifier and filter, a multiplexer, an ADC and a self-testing control module. When the multi-way switch system is operated, the multi-way switch S1 and the switch S4 are off, and touch IC drive access and all sensing pin input access are cut off. The multi-way switch S2 and the switch S3 are on. Drive signals are transmitted through the on-chip capacitor C, amplified and filtered and then transmitted into the multiplexer; the multiplexer is controlled to select suitable signals to transmit to the ADC for sampling, sample data of the ADC is transmitted the self-testing control module and performed optimized least square method linear fitting operation, and then output fitting results. The self-testing built-in framework and the test method integrate the sense amplifier, the filter, the multiplexer and the ADC into a whole, and testing efficiency and cost optimization are obviously improved.

Description

technical field [0001] The invention relates to a built-in self-test method of a touch IC analog front-end, in particular to a built-in self-test system integrating an analog front-end test in a touch IC, belonging to the field of integrated circuit design. Background technique [0002] In integrated circuit design, built-in self-test has been playing a pivotal role in reducing test cost and improving product yield. [0003] In the general analog circuit self-test system: the ADC test often uses "ramp signal" as the stimulus, and the least square method is used to analyze the ADC output results. This method requires a dedicated "ramp wave" generation circuit and other dedicated modules; Amplifiers, filters, and multiplexers self-test circuits, but ignoring this test often results in lower chip yields. Contents of the invention [0004] Considering the above deficiencies and requirements, the present invention proposes a built-in architecture and self-test method for the s...

AI Technical Summary

Problems solved by technology

[0003] In the general analog circuit self-test system: the ADC test often uses "ramp signal" as the stimulus, and the least square method is used to analyze the ADC output results. This method requires a dedicated "ramp wave" generation circuit and other dedicated modules; Amplifiers, filters, multiplexers self-test circuits, but ignoring this test often results in lower chip yields

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