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Probe card assembly and probe needle body including carbon nanotube material body

A carbon nanotube, probe card technology, applied in the field of integration as disclosed in this article, can solve problems such as assembly difficulties, repair challenges, etc.

Active Publication Date: 2016-03-23
温特沃斯实验室公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Such assemblies present unique assembly challenges and difficult repair challenges

Method used

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  • Probe card assembly and probe needle body including carbon nanotube material body
  • Probe card assembly and probe needle body including carbon nanotube material body

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Embodiment Construction

[0011] The disclosed invention includes a probe card assembly comprising an array of carbon nanotube bodies of material incorporated into an insert to bridge the gap between a space transformer and a probe head assembly and when utilizing Straight, substantially rigid probes provide the necessary compliance during testing.

[0012] now refer to figure 1 with figure 2 , some embodiments of the disclosed invention include a probe card assembly 100 for testing a circuit board 102, the probe card assembly 100 including a multi-layered dielectric board 104, a carbon nanotube insert 106, and a plurality of basic Probe 108 is upright and rigid.

[0013] The multilayered dielectric plate 104 is aligned with the integrated circuit 102 . Integrated circuit 102 has arranged on surface 110 a first plurality of electrical contacts 112 arranged in a pattern. The dielectric board 104 has arranged on the surface 114 a second plurality of electrical contacts 116 arranged in a pattern tha...

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Abstract

A probe card assembly for testing circuit boards is disclosed. In some embodiments, the assembly includes the following: a multi-layered dielectric plate aligned with an integrated circuit having a first plurality of dielectric plates arranged in a pattern on a surface of the integrated circuit. contacts, the dielectric board has arranged on a surface of the dielectric board a second plurality of electrical contacts arranged in a pattern, the second plurality of electrical contacts substantially matching the first a plurality of electrical contacts; a nanotube insert interposed between the dielectric plate and the integrated circuit, the nanotube insert having a compliant body of carbon nanotube material, the compliant carbon nanotube material bodies arranged to match said pattern of electrical contacts on said integrated circuit and said dielectric plate; and a plurality of upstanding probes arranged on said nanotube insert and connected to The body of nanotube material engages, via the body of nanotube material, the upstanding probes in electrical contact with the first plurality of electrical contacts and the second plurality of electrical contacts.

Description

[0001] Cross References to Related Applications : This application claims the benefit of US Provisional Application No. 61 / 421,409, filed December 9, 2010, which is incorporated by reference in its entirety as if disclosed herein. Background technique [0002] In the computer chip manufacturing industry, it is necessary to test the performance of integrated circuits (IC's) at various points in the manufacturing process in order to remove defective components and in order to monitor the manufacturing process. To this end, various techniques have been employed, all of which, however, face challenges due to the ever-increasing demands placed on the IC manufacturing process. [0003] To electrically test a circuit, it is necessary to touch pads on the IC, ie to "probe" the IC. The probes must be able to align very precisely with the IC pads under test, and be able to supply enough current to power the IC and be able to provide reliable, low-resistance electrical contact with low ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26
CPCG01R1/06733G01R1/07314G01R31/2886G01R1/067G01R31/26G01R1/07342
Inventor A·布兰多夫
Owner 温特沃斯实验室公司