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Representative-value calculating device and method

A technology of a computing device and a computing method, applied in the field of display, can solve problems such as huge process condition data, and achieve the effects of reducing size differences, improving accuracy, and being easy to compare

Active Publication Date: 2013-09-25
缇拉优特科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] However, the value of process conditions generally changes in seconds, and there are dozens or even hundreds of process conditions in a process system, so the data on process conditions is very large

Method used

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  • Representative-value calculating device and method
  • Representative-value calculating device and method
  • Representative-value calculating device and method

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Embodiment Construction

[0030] best practice

[0031] Below, the present invention will be described in detail in conjunction with the accompanying drawings.

[0032] figure 1 It is a schematic diagram of a representative value calculation device according to an embodiment of the present invention.

[0033] Such as figure 1 As shown, the representative value calculation device 100 includes a sensor 110 , an extraction unit 120 , a first calculation unit 130 , a second calculation unit 140 , a third calculation unit 150 , a control unit 160 and a display unit 170 .

[0034] The representative value calculation device 100 can be installed in a process device and a process system.

[0035] The sensor 110 can be arranged in a process device or a process system, and can measure process condition values ​​according to different samples at a set period. The process conditions are various conditions necessary for the process, such as temperature, pressure, time, and the position of the product.

[0036]...

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Abstract

Provided is a representative-value calculating device for calculating a representative value of process condition values by using values of process conditions measured in a process system. The representative-value calculating device according to an embodiment of the present invention calculates a median and a median absolute deviation (MAD) of process condition values at each sampling point by using the process condition values measured for each sample at each sampling point through a sensor; calculates a standardized value by using the process condition values, the median, and the MAD; and calculates a representative value of the process condition values for each sample on the basis of the calculated standardized values.

Description

technical field [0001] The present invention relates to a technique for calculating representative values ​​by using sensing values ​​of process conditions in a process system and displaying the calculated representative values ​​on a display unit. Background technique [0002] Advanced equipment such as semiconductors and LCDs require huge investment costs. In particular, a substantial portion of the costs goes to the acquisition of equipment. Therefore, in manufacturing companies that use cutting-edge equipment to produce products, it is necessary to continuously explore to improve equipment utilization. [0003] One solution to improve equipment utilization is the technology of detecting misoperations by monitoring data on process conditions such as temperature, pressure, and time. [0004] Process systems may have sensors for measuring process condition data over time. The user can give the data measured by the sensor to grasp the value of the time-varying process con...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F19/00G06F17/18
CPCG06F17/18
Inventor 具兴燮
Owner 缇拉优特科技有限公司
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