Composite material multi-nail and double-shear connection failure prediction method based on three-parameter characteristic curve
A characteristic curve, composite material technology, applied in the direction of using stable shear force to test material strength, using stable tension/compression to test material strength, etc., can solve the problem of not considering shear characteristic points and wrong limit load prediction results , misjudgment failure mode and other problems, to achieve the effect of improving structural design efficiency, avoiding structural design improvement work, and avoiding repeated futility
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0043] The specific implementation process will be further described in detail below in conjunction with the flow chart.
[0044] Such as figure 1 As shown, in the classical characteristic curve method, the tensile characteristic size and the compressive characteristic size are used to determine the classical characteristic curve of the cosine distribution form, and its expression is:
[0045] r c (θ) = r 0 +R t +(R c -R t )cosθ -90°≤θ≤90°
[0046] Among them, R t and R c are the tensile and compressive characteristic dimensions, respectively, determined by experiments. r0 is the radius of the key hole, and θ is the angle rotated counterclockwise from the longitudinal compression plane of the composite multi-nail double-shear connection to the tension plane. The failure mode of the connection structure is determined according to the position of θ: when 0°≤|θ|≤15°, it is extrusion failure; when 30°≤|θ|≤60°, it is shear failure; when 75°≤ When |θ|≤90°, it is tensile fa...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com