Direct current side circuit of IGCT (integrated gate commutated thyristor) converter/test circuit and method for designing parameters of clamp capacitor and clamp resistor of direct current side circuit
A technology for testing circuits and clamping capacitors, applied in the field of power electronics, can solve problems such as no design criteria for clamping circuits, low IGCT current conversion rate di/dt, and inability to obtain optimal performance.
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[0039] The present invention will be further described below in conjunction with accompanying drawing.
[0040] see Figure 1 to Figure 3 As shown, the IGCT converter / test circuit includes a DC side circuit and a conversion circuit, and the conversion circuit includes one or more IGCT devices. The DC side circuit includes a DC capacitor C DC , snubber inductance L i , clamping diode D CL , clamp capacitor C CL and clamp resistor R CL ; DC capacitance C DC The positive terminal of the snubber inductor L is connected i One terminal and the clamping resistor R CL One end of the snubber inductance L i The other end of the clamping diode D is connected CL positive terminal, the clamping resistor R CL The other end of the clamping diode D is connected CL Negative, clamping diode D CL The negative terminal of the clamp capacitor C is connected CL One end of the clamping capacitor C CLConnect the other end of the DC capacitor C DC The negative pole of the conversion cir...
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