Display panel detection method

Abstract

A display panel and a detection method thereof are provided. Wireless signals are transmitted to a gate-line wireless sensing electrode connected to gate lines and a data-line wireless sensing electrode connected to data lines that are preset at a dummy zone of the display panel (1, 1′), respectively, through wireless signal transmitting electrodes (6) connected to a transmitter, so as to generate a gate-line detection signal and a data-line detections signal, thereby realizing detection of the display panel. The gate-line wireless sensing electrode and the data-line wireless sensing electrode are formed at the dummy zone on the array substrate (1, 1′) in the technological process of producing the gate lines and the data lines of the array substrate of the display panel, respectively. Therefore, poorness of a display can be detected without cutting of a display panel (1, 1′), poorness is detected early, and repair is made timely. Thus, the issue that a defective product flows to a subsequent process and a waste of cost results from it is avoided.

Description

technical field [0001] The invention relates to the technical field of displays, in particular to a display panel detection method. Background technique [0002] During the manufacturing process of TFT-LCD, it is unavoidable that display defects occur. Liquid crystal display defects are mainly divided into two categories: non-electrical defects and electrical defects. There are many reasons for non-electrical defects, which are related to materials and processes. Specifically, materials that cause non-electrical defects include liquid crystals, metal electrode layers (gate, source and drain), insulating layers, orientation layer and sealant etc. Defects in any step in the process of making the above material layers can cause non-electrical defects, such as: horizontal black lines, white lines, black spots, etc. The main cause of electrical defects is array process defects, such as bright lines, bright spots, The signal line is disconnected, etc. [0003] In order to quic...

AI Technical Summary

Problems solved by technology

However, detection cannot be realized before the liquid crystal cell is cut, such as figure 1 The dummy area shown in the dotted line box in the middle, because the probe unit in the Cell detection equipment cannot perform probe detection in the dummy area of ​​each liquid crystal cell 1 to be cut before cutting, that is, the probe cannot touch the signal line lead

[0004] Existing liquid crystal cell detection requires that after the CF substrate and TFT substrate are aligned, the liquid crystal substrate can be cut to form a single liquid crystal cell before detection can be performed. In this way, the feedback of bad information is delayed, resulting in waste of subsequent production costs, and the traditional detection after cutting uses The investment cost of contact lighting equipment is extremely high

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