Independent five-degree-of-freedom ultra-precise material in-situ test microscopic observation platform

A technology of in-situ testing and degrees of freedom, applied in the field of precision scientific microscopic observation instruments, can solve problems such as limited cavity space, difficulty in achieving specimens, and synchronous tracking, achieving good tracking effect, strong practicability, and compact size. Effect

Active Publication Date: 2014-01-08
JILIN UNIV
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  • Description
  • Claims
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Problems solved by technology

[0004] There are still some deficiencies in the current in-situ observation equipment: (1) The current commercial microscopes are difficult to meet the large-stroke lens movement capability, which restricts the in-situ observation of large specimens; (2) Due to the influence of the external environment, in some The specimen under load is often in a state of micro-vibration, and it is difficult for the current commercial microscopes to follow the specimen synchronously to ensure stable imaging of the observed area; (3) the cavity of the scanning electron microscope and atomic force microscope Space is very limited, making it difficult to observe specimens in situ at the macro scale

Method used

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  • Independent five-degree-of-freedom ultra-precise material in-situ test microscopic observation platform

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Embodiment Construction

[0028] The detailed content of the present invention and its specific implementation will be further described below in conjunction with the accompanying drawings.

[0029] see Figure 1 to Figure 7 As shown, the independent five-degree-of-freedom ultra-precision material in-situ testing microscopic observation table of the present invention is mainly composed of X, Y, and Z-axis moving assemblies 14, 12, 11, X, and Z-axis rotating assemblies 7, 6, and X, Y-Z Axis flexible hinge type ultra-precision follower components 5, 2 and super depth-of-field observation lens 9 are composed.

[0030] The Y-axis moving assembly 12 is installed on the X-axis moving assembly 14, and the Z-axis moving assembly 11 is installed on the Y-axis moving assembly 12; the following assembly base plate 1 is installed on the Z-axis moving assembly 11, and the Y-Z axis following assembly 2 is installed on the bottom plate 1 of the follower assembly through the hexagon socket head cap screw 3, and the X...

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Abstract

The invention relates to an independent five-degree-of-freedom ultra-precise material in-situ test microscopic observation platform and belongs to precise scientific microscopic observation instruments. The platform is composed of X-axis, Y-axis and Z-axis precise movable assemblies, X-axis and Z-axis rotary assemblies, X-axis, Y-axis and Z-axis flexible hinge type ultra-precise following assemblies and a super-view deep observation lens. The X-axis, Y-axis and Z-axis precise movable assemblies and the X-axis and Z-axis rotary assemblies can be used for respectively carrying out precise adjustment on relative positions and relative angles of the super-view deep observation lens in X, Y and Z directions of an observation test piece; the X-axis, Y-axis and Z-axis flexible hinge type ultra-precise following assemblies can realize active following of the test piece in microseismic movement relative to a load in the X, Y and Z directions; and the Y-axis precise movable assembly can assist the super-view deep lens in zooming. The super-view deep lens is used for carrying out super-view deep observation on the shape of a microcosmic surface of the test piece. The independent five-degree-of-freedom ultra-precise material in-situ test microscopic observation platform has the advantages of ingenious volume, precise driving, good following effects, high integration and strong practicability, can be used independently and can also be combined other equipment to use.

Description

technical field [0001] The invention relates to a precision scientific microscopic observation instrument, in particular to an independent five-degree-of-freedom ultra-precision material in-situ testing microscopic observation platform integrating ultra-depth-of-field microscopic observation, precision driving and active following. It can provide in-situ monitoring for various materials under different load states, and reveal the mechanical properties and damage mechanism of materials at the micro-nano scale. ) technology and other high-tech industries have an extremely important role in promoting the development. Background technique [0002] Material testing technology is an important means and method for material science and engineering applications. All parts are inevitably subjected to force or temperature in the actual use process. After certain use conditions and use time, the material will undergo deformation, wear, surface pitting and other failure phenomena. Micr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/24
Inventor 赵宏伟任露泉高景董晓龙邵明坤张鹏程虹丙唐可洪范尊强张志辉张富朱冰邹青裴永茂董景石张启勋朱玉祥李法新呼咏马敬春
Owner JILIN UNIV
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