Orthogonal spectroscopic imaging pose testing method and sensor for landmark points

Abstract

A mark-point orthogonal spectroscopic imaging position / pose measuring method and a sensor relate to position / pose measuring, and aim at realizing large-scope high-precision rapid monocular vision position / pose measurement, satisfying the requirements on space position / pose measuring and positioning in aviation spaceflight tasks such as aiming, positioning, space coordinate measuring, cooperated move of space objects, and the like. The employed technical scheme is that: the mark-point orthogonal spectroscopic imaging position / pose sensor consists of an imaging lens, a spectroscope, two cylindrical mirrors, two linear array CCD arranged in an orthogonal manner and DSP; a mark point passes through an object lens and forms a circle light spot, the circle light spot passes through the spectroscope for beam splitting and forms two light beams being mutually orthogonal; the two cylindrical mirrors are respectively disposed at the propagation directions of the two light beams, the two linear array CCD are respectively disposed at the perpendicular bisecting planes of two generated linear images, each linear image intersects the corresponding linear array CCD and an image is formed on the linear array CCD; and DSP is used for resolving the protection line of the mark point according to the two-dimension coordinate of the mark point, and outputting the information. The mark-point orthogonal spectroscopic imaging position / pose measuring method and the sensor are mainly applied to position / pose measuring.

Description

technical field [0001] The invention relates to a pose sensor, and is especially suitable for high-speed, large-range and high-precision pose measurement. Specifically, it relates to a marker point orthogonal spectroscopic imaging pose testing method and a sensor. technical background [0002] The monocular vision pose sensor can achieve large measurement field of view measurement, but the data volume of the area array CCD is relatively large in the process of data acquisition, which greatly limits the acquisition speed of image data during the pose measurement process of the area array CCD. Usually, only 4-6 spatial feature points are used in the pose measurement process, which occupies very few pixels on the camera image plane. This structure has a relatively low utilization rate of the data on the area array CCD. At the same time, the pixel resolution of the area array CCD also limits the accuracy of spatial pose measurement. [0003] Linear array CCD can realize high-s...

AI Technical Summary

Problems solved by technology

However, the special structure of the linear array CCD can only complete one-dimensional measurement

In order to realize the three-dimensional pose measurement, the existing technology is to combine several linear array CCDs, but in this multi-line array CCD-based pose measurement process, the feature points must be within the common field of view of multiple linear array CCDs , which greatly limits the measurement range of the multi-line array CCD pose measurement system

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