Method and device for testing peripheral compatibility of electronic device

A technology for compatibility testing and electronic equipment, which is applied in the field of electronic equipment peripheral compatibility testing, can solve problems such as inconvenient acquisition of test results analysis, error-prone, compatibility issues, etc., to save time and the probability of errors, and improve testing Efficiency, ease of analysis

Active Publication Date: 2014-01-22
FUJIAN LANDI COMML EQUIP CO LTD
View PDF11 Cites 18 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Subsequently, there are more and more types of peripherals around electronic devices, but due to the differences in hardware and systems of electronic devices, there will be compatibility problems between different peripherals and different electronic devices. Compatibility testing
However, in the existing compatibility test method, it is necessary to manually install the test program to the electronic device under test, and then test the compatibility through the test program. bugs that go wrong
In addition, the test report and / or test log generated by the test program in the existing test method needs to be manually imported to the PC for viewing, which is not convenient for testers to quickly obtain test results for analysis

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] In order to describe in detail the technical content, structural features, achieved objectives and effects of the present invention, the following will be described in detail in conjunction with the embodiments.

[0028] The invention provides a method for testing the compatibility of electronic equipment peripherals, which comprises the steps of:

[0029] A), test acquisition, the electronic device obtains the test program from the server and automatically installs it;

[0030] Preferably, this step A may specifically include the steps,

[0031] A1), the electronic device sends a query request for the existence of the test program to the server through the Internet (TCP) or mobile communication network (mobile communication network) or short message (SMS, MMS).

[0032] The query request here can be either a request for the electronic device to obtain the test program for the first time, or a query request for the electronic device that has already installed the test ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a method and a device for testing the peripheral compatibility of an electronic device. Newest or specific test program is automatically inquired from the server side through the electronic device side and automatically installed, test reports are automatically submitted after an electronic device finishes testing, then the server side classifies, memorizes backs up received reports according to types, and meanwhile all of types of intuitive test reports are generated. Furthermore, the time for manual installation of the test program is saved, the error occurrence probability is reduced, and meanwhile the testing efficiency is improved. In addition, intuitive reports are generated by analyzing test results, and analysis of developers is facilitated.

Description

technical field [0001] The invention relates to the field of electronic product testing, in particular to a method and device for testing the compatibility of electronic equipment peripherals. Background technique [0002] With the development of technology, various electronic devices (such as mobile phones, tablet computers, MP4, etc.) have penetrated into people's daily life in large quantities. Subsequently, there are more and more types of peripherals around electronic devices, but due to the differences in hardware and systems of electronic devices, there will be compatibility problems between different peripherals and different electronic devices. Compatibility testing. However, in the existing compatibility test method, it is necessary to manually install the test program to the electronic device under test, and then test the compatibility through the test program. bugs that go wrong. In addition, the test report and / or test log generated by the test program in the...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
Inventor 林伟林亮林晋安林桓
Owner FUJIAN LANDI COMML EQUIP CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products