A device parameter optimization method for an integrated circuit

Abstract

The invention provides a method for optimizing a device parameter of an integrated circuit. The method for optimizing the device parameter of the integrated circuit comprises the steps that (A) the initial value of the parasitic parameter of the integrated circuit is extracted; (b) a first function is constructed according to the initial value of the device parameter and the initial value of the parasitic parameter, wherein the first function symbolizes the relation between the parasitic parameter value and the device parameter value; (C) the circuit parameter of the integrated circuit is determined according to the parasitic parameter value and the device parameter value, whether the circuit parameter meets predetermined requirements is judged, and the device parameter value is adjusted if the circuit parameter does not meet the predetermined requirements; (D) a calculating value of the parasitic parameter is obtained according to the adjusted device parameter value and the first function, and then the step (C) is executed. The method for optimizing the device parameter of the integrated circuit has the advantages that the defects, in the prior art, that a software tool needs to be used repeatedly to extract the parasitic parameter and a physical map needs to be adjusted repeatedly are overcome, the efficiency of optimizing of the device parameter of the integrated circuit is improved, and the automation of the optimizing of the device parameter of the integrated circuit can be achieved easily.

Description

technical field [0001] The invention relates to the technical field of integrated circuit design, in particular to a device parameter optimization method of an integrated circuit. Background technique [0002] The device parameter optimization of integrated circuits is an important and time-consuming stage in the design process of integrated circuits. The final actual electrical performance of integrated circuits depends not only on the device parameter values ​​of integrated circuits, but also on the parasitic effects of the device itself, the inter-device The parasitic effect of the connection itself, the parasitic effect of the connection itself, the parasitic effect between the connection, and the parasitic effect between the connection and the device. [0003] At present, the process flow of device parameter optimization methods for integrated circuits is as follows: figure 1 shown. Among them, the operation of extracting the parasitic parameters of the integrated cir...

AI Technical Summary

Problems solved by technology

[0005] In view of this, the present invention provides a device parameter optimization method for an integrated circuit, which aims to solve the problem that the acquisition of parasitic parameters in the process of device parameter optimization of an integrated circuit is too long due to the dependence on physical layout and parasitic parameter extraction tools, resulting in integration Difficult to realize automation of circuit device parameter optimization

Images