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Modular probe assembly with force protection and articulation

A modular and probe technology, which is applied to measuring instrument components, parts of electrical measuring instruments, instruments, etc., can solve problems such as rough adjustment of probe brackets, throwing aside, probe damage, etc.

Inactive Publication Date: 2017-12-19
TEKTRONIX INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there is still a risk of damage to the probe during the affixing of the probe to the support, as any reliance on a raw thumb is fraught with danger
Also, adjustments to the probe holder can be rough and may not position the probe according to the engineer's wishes
Engineers who are dissatisfied with the ability of the stand to properly position said probes may toss it aside and rely on handheld positioning, again risky

Method used

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  • Modular probe assembly with force protection and articulation
  • Modular probe assembly with force protection and articulation
  • Modular probe assembly with force protection and articulation

Examples

Experimental program
Comparison scheme
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Embodiment Construction

[0018] figure 1 An embodiment of a modular probe assembly 100 for use with a signal processing instrument (not shown) is depicted. In this embodiment, the modules may be selected from the following: (1) probe tip module 110; (2) protection module 120; (3) hinge module 130; (4) handle module 140; to the module on the probe manipulator 150. exist figure 1 , two configurations of the component are shown. In a first configuration, the probe tip module 110 may be attached to the protective module 120 which may be attached to the articulation module 130 and which may also be attached to the probe manipulator module 150 . same, figure 1 A second configuration is shown in which the handle module 140 is connected to the hinge module 130 and further connected to the protection module 120 which is terminated by the probe tip module 110 .

[0019] The alignment, configuration and selection of modules can be arbitrary. It must be considered whether the module in the assembly has a ta...

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Abstract

The present invention provides a modular probe assembly for a signal processing instrument having an elongate member extending from a first block of the probe assembly and a cavity recessed in a second block of the probe assembly. The cavity of the second module is structured to receive the elongated member of the first module. A module for a probe assembly may have a first hinged elongate member disposed at one end of the housing of the module. An elongated member extending from the first block of the probe assembly is insertable within the cavity recessed in the second block, and the first block is removably engaged to the second block.

Description

technical field [0001] The present invention relates to a modular probe assembly with force protection and articulation. Background technique [0002] Electronic devices commonly used today would not be possible without the use of delicate measuring instruments to design them. Common types of measurement devices found in engineering laboratories are oscilloscopes, logic analyzers, and other types of signal processing instruments. These devices show engineers the wave patterns that electrical signals can exhibit when they are generated within the components of the device under study. Understanding these wave patterns helps engineers understand whether the device is behaving as expected. [0003] Hand probes are usually connected to these instruments with cables. Touching the probe to a portion of the device under test allows the engineer to view the signal as displayed by the instrument's view port. As electronic devices have become smaller and the frequency signals gener...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/067
CPCG01R1/06788G01R1/067G01D11/24G01D11/30
Inventor J.E.斯皮纳K.A.格里斯特
Owner TEKTRONIX INC