Synchronizing and local oscillating device in TD-LTE-A (time-division long term evolution advanced) integrated tester

A comprehensive measuring instrument, digital synthesis technology, applied in the direction of electrical components, automatic power control, etc., can solve the problem of low output frequency

Active Publication Date: 2014-03-12
CHINA ELECTRONIS TECH INSTR CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] Aiming at the problems of low frequency band, resolution and frequency synthesis output frequency of the comprehensive tester in the related ar

Method used

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  • Synchronizing and local oscillating device in TD-LTE-A (time-division long term evolution advanced) integrated tester
  • Synchronizing and local oscillating device in TD-LTE-A (time-division long term evolution advanced) integrated tester
  • Synchronizing and local oscillating device in TD-LTE-A (time-division long term evolution advanced) integrated tester

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Embodiment Construction

[0023] In order to solve the problem of low frequency band, resolution and frequency synthesis of the comprehensive tester in the related art, the present invention provides a synthetic local oscillator device in the TD-LTE-Advanced comprehensive tester. The invention is described in further detail. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0024] This embodiment provides a synthetic local oscillator device in a TD-LTE-Advanced comprehensive testing instrument, figure 1 It is a structural block diagram of a synthetic local oscillator device in a TD-LTE-Advanced comprehensive tester according to an embodiment of the present invention, as figure 1 As shown, the device includes: a sampling loop 10 , a sampler module 20 , a direct digital synthesis module 30 , a local oscillator generation module 40 and a reference distribution circuit 50 . The structure is described ...

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Abstract

The invention discloses a synchronizing and local oscillating device in a TD-LTE-A (time-division long term evolution advanced) integrated tester. The device comprises a sampling ring, a sampler module, a direct digital synchronizing module, a local oscillating generating module and a reference distributing circuit, wherein the sampling ring is used for providing a 207-236 MHz sampling local oscillating signal for a sampler and sampling input radio frequency, the sampler module is an intermediate combination module of the sampling ring and the local oscillating generating module, and is used for executing frequency sampling and frequency spectrum shift, the direct digital synchronizing module is used for realizing the frequency resolution of the whole local oscillating and executing fractional frequency division, the local oscillating generating module adopts an economical broadband VCO and covers the frequency band of 5.0-10.0GHz, and the reference distributing circuit is used for providing frequency reference for the frequency synthetic modules through various frequency division circuits and frequency multiplier circuits. The problem that the frequency band, the resolution ratio and the frequency synthetic output frequency of the integrated tester are low in the related technology is solved.

Description

technical field [0001] The invention relates to the application field of radio frequency conformance testing of TD-LTE-Advanced terminals, in particular to a synthetic local oscillator device in a TD-LTE-Advanced comprehensive testing instrument. Background technique [0002] TD-LTE-A (Time Division-Long Term Evolution Advanced) with independent intellectual property rights has become one of the international standards of IMT-A (International Mobile Telecommunications). Compared with TD-LTE, it has more technical advantages. In various tests and verifications of mobile communication terminal products, the radio frequency and radio frequency conformance test of the terminal is a key link to check whether the terminal product meets the requirements of the radio frequency test specification. [0003] 3GPP TS36.521 defines all test cases of TD-LTE-A terminals. Compared with TD-LTE, TD-LTE-A requires terminal RF conformance test equipment to output frequency resolution of 1Hz and...

Claims

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Application Information

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IPC IPC(8): H03L7/07H03L7/18
Inventor 黄武陶长亚周建烨
Owner CHINA ELECTRONIS TECH INSTR CO LTD
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