Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Automated topology dynamic mapping method and system

A technology of dynamic mapping and topology, applied in transmission systems, digital transmission systems, electrical components, etc., can solve the problems of manual construction of the environment, can not fully realize automation, etc., to achieve the effect of improving efficiency

Inactive Publication Date: 2014-03-19
PHICOMM (SHANGHAI) CO LTD
View PDF3 Cites 17 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In automated testing, each test suite is equipped with different logical topologies. Testers need to build different physical topologies according to the logical topologies. During the execution of automated scripts, they need to be run in batches. Before running, the environment needs to be manually built. fully automated

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Automated topology dynamic mapping method and system
  • Automated topology dynamic mapping method and system
  • Automated topology dynamic mapping method and system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0030] In order to make the purpose, technical solution and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0031] refer to figure 1 , figure 2 , the automatic topology dynamic mapping method of an embodiment provided by the present invention, comprising:

[0032] Step S10, connecting all the devices under test to a physical switch;

[0033] The physical switch working on the first layer (also known as cross connect switch, crossbar switch, crosspoint switch, or matrix switch), provides programmable connection from any port to any port, non-blocking switching backplane, 100% to the upper layer protocol transparent. By default, the ports are not connected, and instructions need to be issued to pr...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an automated topology dynamic mapping method and an automated topology dynamic mapping system. The automated topology dynamic mapping method includes the following steps that: step 1, all tested apparatuses are connected to a physical switch; step 2, attributes of the tested apparatuses and a physical topology of the tested apparatuses and the physical switch are described; step 3, a logical topology of test cases is described; and step 4, the logical topology of the test cases is mapped to the physical topology. With the method of the invention adopted, a certain number of tested apparatuses are connected with one switch, such that a test bed can be formed; according to the attributes of the tested apparatuses and the physical topology of the tested apparatuses and the physical switch, the logical topology of the test cases is mapped to the physical topology; environments are not required to be built manually among each test case to form a corresponding logical topology; reasonable tested apparatuses are connected with one switch, such that the physical topology required by a certain number of test cases can be provided; environments are not needed to be rebuilt for each test case; and therefore, the efficiency of automated test can be improved.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to an automatic topology dynamic mapping method and an automatic topology dynamic mapping system. Background technique [0002] In recent years, as the complexity of testing continues to climb, testing consumes more and more resources. How to improve testing efficiency and reduce costs has become a concern of every tester. [0003] In automated testing, each test suite is equipped with different logical topologies. Testers need to build different physical topologies according to the logical topologies. During the execution of automated scripts, they need to be run in batches. Before running, the environment needs to be manually built. Fully automated. Contents of the invention [0004] Based on this, it is necessary to provide an automatic topology dynamic mapping method, including: [0005] Step 1: Connect all devices under test to a physical switch; [0006] Step 2: describe...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H04L12/26H04L12/751H04L45/02
Inventor 薛雪王飞
Owner PHICOMM (SHANGHAI) CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products