A vacuum water cooling test device
A test device, vacuum water cooling technology, applied in the direction of measuring device, optical instrument test, machine/structural component test, etc., can solve the problems of low power consumption, small size, etc., and achieve compact structure, strong anti-interference ability and stable work Effect
Inactive Publication Date: 2015-09-30
ZHEJIANG UNIV
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Problems solved by technology
The traditional incubator cannot meet the conditions of large-scale rapid temperature change, vacuum environment, small size of the test device itself, low power consumption, and no vibration during the test.
Method used
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Embodiment Construction
[0025] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.
[0026] Such as figure 1 As shown, a vacuum water-cooling test device includes a bracket 1, a copper base 2, a top cover 3, a water pipe support 4, an airtight connector 5, a water inlet pipe 6, a water outlet pipe 7, a TEC group 8 (semiconductor refrigerator), Upper TEC9, TEC drive board 10, vacuum pump 11, gas pipe 12, temperature sensor group 13, main control board 14, power supply 15 and upper computer 16;
[0027] The copper base 2 is fixed on the bracket 1, the top cover 3 is placed on the copper base 2 through an airtight gasket, the water pipes are evenly arranged inside the water pipe support 4 and fastened on the copper base 2, and the water inlet pipe 6 and the water outlet pipe 7 are connected with the copper base 2 respectively. Both ends of the water pipe inside the water pipe support 4 are connected, and the airtight connector...
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The invention discloses a vacuum water-cooling testing device. The vacuum water-cooling testing device comprises a support, a copper base, a top cover, a water pipe support, an airtight connector, a water inlet pipe, a water outlet pipe, a TEC (Thermoelectric Cooler) group, an upper TEC, a TEC drive plate, a vacuum pump, an air tube, a temperature sensor group, a main control board, a power supply and an upper computer, wherein the copper base is fixed on the support, the top cover is placed on the copper base, the water pipe support is fastened on the copper base, the water inlet pipe and the water outlet pipe are respectively connected to two ends of a water pipe in the water pipe support, the airtight connector is arranged on the copper base; the TEC drive plate, the vacuum pump, the main control board, the power supply and the upper computer are arranged on the support, the TEC group and the upper TEC are connected to the TEC drive board by leads through the airtight connector, and the air tube is connected to the vacuum pump through the airtight connector. The vacuum water-cooling testing device has the advantages of compact structure, stable work, simplicity in operation, high efficiency, energy conservation and strong anti-interference capacity as well as the characteristics of quick heating and refrigeration, and minimal introduction of vibration, and is particularly suitable for testing vibration-sensitive optical devices or devices.
Description
technical field [0001] The invention relates to a test device, in particular to a vacuum water-cooled test device. Background technique [0002] Temperature characteristics are an extremely important performance index of many devices and devices, especially in some specific applications. For some temperature-sensitive devices and devices, temperature performance has become one of the most important factors restricting their applications. For example, under harsh conditions such as aviation environments and military applications, some precision optical measurement units are extremely sensitive to ambient temperature, and extreme temperatures will deteriorate the performance of optical devices and equipment, or even fail to work. Therefore, it is an important part to study the stability of the system to test the performance of temperature-sensitive devices in a wide range. Not only that, in some applications, we need to simulate the temperature performance of the test device ...
Claims
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IPC IPC(8): G01M11/00F25B21/02
Inventor 庞斌黄腾超贺青舒晓武刘承
Owner ZHEJIANG UNIV