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An array substrate

A technology for arraying substrates and testing signals, applied in nonlinear optics, instruments, optics, etc., can solve the problems of expensive probes and high testing costs, and achieve the effects of reducing testing costs, improving accuracy, and reducing the use of probes

Active Publication Date: 2017-04-05
HEFEI BOE OPTOELECTRONICS TECH +1
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0011] Probes that can be used at high temperatures are expensive, resulting in higher testing costs

Method used

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  • An array substrate
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Embodiment Construction

[0030] In order to make the technical problems, technical solutions and advantages to be solved by the present invention clearer, the following will describe in detail with reference to specific embodiments and accompanying drawings.

[0031] The embodiment of the present invention solves the problem that when the impurity ions in the panel are quantitatively tested, the test signals in different types of test signal transmission lines are different, resulting in inaccurate detection, and the number of fixture probes used is large. The embodiment of the present invention provides An array substrate, such as figure 1 As shown, wherein the array substrate includes: different types of data lines arranged in the array substrate;

[0032] Corresponding to each type of data line, there is a first test signal input terminal ( figure 1 There are 3 types of data lines, and the corresponding first test signal input terminals are 3, which are DC, DM and DY) test signal transmission li...

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Abstract

The invention provides an array substrate, for solving the problem that when foreign ions in a panel is in test, test signals in different types of test signal transmission lines have differences, so that the test is inaccurate and the quantity of probes in a used fixture is large. The array substrate comprises different types of data lines arranged in the array substrate; test signal transmission lines; a switch structure, connected with the test signal transmission lines; a second test signal input terminal, electrically connected with one test signal transmission line; a control signal input terminal, connected with the switch structure, for outputting a control signal to the switch structure, so as to control the state of the switch unit in the switch structure by the control signal, to connect the test signal transmission line electrically connected with the second test signal input terminal and other test signal transmission lines, and to enable the test signal input by the second test signal input terminal to transmit to all test signal transmission lines. According to the array substrate, the test cost is reduced.

Description

technical field [0001] The present invention relates to display technology, in particular to an array substrate. Background technique [0002] Thin film transistor liquid crystal display TFT-LCD is used as the display element of products such as mobile phones, Pads, notebook computers, monitors and televisions, and has become indispensable in today's life. [0003] Therefore, in the existing array substrate, different test signal input terminals have been preset for the test panel. [0004] Such as figure 2 As shown, the existing array substrate includes different types of data lines arranged in the array substrate, such as the data lines corresponding to the red, green and blue sub-pixels; meanwhile, corresponding to each type of data line, there is a first The test signal transmission line of the test signal input terminal (in the figure 2 In the above, the array substrate with double gate structure is taken as an example, the first test signal input terminals are respe...

Claims

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Application Information

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IPC IPC(8): G02F1/13G02F1/1333
Inventor 黄式强周纪登
Owner HEFEI BOE OPTOELECTRONICS TECH
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